Research Profile

Mircea Gabriel Modreanu

Biography

EDUCATION:

1993 - Master of Science degree in Atomic and Molecular Physics from Faculty of Physics, University of Bucharest.

2001 –Ph.D.degree in Condensed Physics Matter (Magna cum Laude), from University of Bucharest. The thesis is dedicated to the theoretical and experimental study of deposition kinetics, optical,electrical and structural properties of amorphous and crystalline silicon, silicon nitride, silicon oxynitride and silicon-rich nitride and doped and undoped SiO2 CVD thin films.

 

POSITIONS HELD  :

2006-             Tyndall National Institute , Cork, Ireland, Staff Research Scientist, Optical Spectroscopy Laboratory  Manager

2002-2006       National Microelectronics Research Centre, Cork, Ireland, Post Doctoral Fellow

1999-2001       National Institute for R&D for Microtechnologies, Bucharest, Romania:Senior Researcher: research, development and characterization of CVD thin films for semiconductors and MOEMS technologies

1995- 1999    National Institute for R&D for Microtechnologies, Bucharest, Romania:

Process Engineer: APCVD&LPCVD process sustaining and development for MOS and microsensors technologies

1993- 1995    National Institute for R&D for Microtechnologies, Bucharest, Romania:

Process Engineer: APCVD process sustaining and development for MOS technologies.

EXPERIENCE :

a) In the research and development of the MOS microelectronic and nanolectronics technology.

b) In the research field of microsystem (MEMS) and optoelectronics (MOEMS) technology

c) In the production field for the fabrication of new instrumentation

d) Development of novel material for transparent electronics and optoelectronics application

e) Optical spectroscopy for stem cells and biomedical studies

 

PROFESSIONAL ACTIVITIES

  • European Materials Research Society (E’MRS) member

  • Organiser and Chairman for the “Optical and X-Ray Metrology for Advanced Device Materials Characterization” related Symposia at E’MRS 2003 Spring Meetings, E’MRS 2005 Spring Meetings, E’MRS 2007 Fall Meetings, E’MRS 2012 Spring Meetings and E’MRS 2015 Spring Meetings  (http://www-emrs.c-strasbourg.fr)

     

    Publication

    - 105 per-review papers in international journals (h-index 15)

    -20 invited talks at prestigious international conferences

     

Research Interests

Functional metal oxides:

-dielectrics (high k materials, tunable refractive index materials)

-semiconductors (n-type TCOs, p-type TCOs)

Advanced optical spectroscopy of thin films and their interfaces:

-amorphous to crystalline phase transition

-interfacial properties

-optical properties ( UV down to Far IR spectral range)

-vibrational properties (IR and Raman)

-spectroscopic ellipsometry

-optical spectrophotometry

-surface and tip enhanced IR and Raman spectrocopy

 Transparent electronics

Virtual substrates for novel optoelectronic devices and for high efficiency solar cells

Integration of III-V materials on Si

Research Grants

 ProjectFunding
Body
Start DateEnd DateAward
Carbon Based Smart Systems For wireless applications.European Framework Programme Seven (FP7)03-SEP-1208-SEP-15€290,000.00

Publications

Editorship

 YearPublication
(2013)Special issue on Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III, E-MRS Spring 2012-Symposium W, held in Strasbourg, France, May 14-18, 2012.
Modreanu, M,Durand, O,Jellison, GE,Salviati, G,Fried, M (2013) Special issue on Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III, E-MRS Spring 2012-Symposium W, held in Strasbourg, France, May 14-18, 2012. Editorship [DOI] [Details]

Other Journals

 YearPublication
(2014)'Effect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films'
Gartner, M. and Stroescu, H. and Marin, A. and Osiceanu, P. and Anastasescu, M. and Stoica, M. and Nicolescu, M. and Duta, M. and Preda, S. and Aperathitis, E. and Pantazis, A. and Kampylafka, V. and Modreanu, M. and Zaharescu, M. (2014) 'Effect of nitrogen incorporation on the structural, optical and dielectric properties of reactive sputter grown ITO films' Applied Surface Science, 313 :311-319.   [Details]
(2014)'Carboxyl functionalised MWCNT/polymethyl methacrylate bone cement for orthopaedic applications'
Ormsby, R.W. and Modreanu, M. and Mitchell, C.A. and Dunne, N.J. (2014) 'Carboxyl functionalised MWCNT/polymethyl methacrylate bone cement for orthopaedic applications' Journal of Biomaterials Applications, 29 (2) :209-221.   [Details]
(2013)'Electron scattering mechanisms in fluorine-doped SnO2 thin films'
Rey, G. and Ternon, C. and Modreanu, M. and Mescot, X. and Consonni, V. and Bellet, D. (2013) 'Electron scattering mechanisms in fluorine-doped SnO2 thin films' Journal of Applied Physics, 114 (18) .   [Details]
(2013)'Structural and luminescence properties of HfO2 nanocrystals grown by atomic layer deposition on SiC/SiO2 core/shell nanowires'
Rossi, F. and Fabbri, F. and Tallarida, M. and Schmeisser, D. and Modreanu, M. and Attolini, G. and Salviati, G. (2013) 'Structural and luminescence properties of HfO2 nanocrystals grown by atomic layer deposition on SiC/SiO2 core/shell nanowires' Scripta Materialia, 69 (10) :744-747.   [Details]
(2013)'Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of indium tin oxide and nitrogen doped indium tin oxide rf-sputtered thin films'
Stroescu, H. and Anastasescu, M. and Preda, S. and Nicolescu, M. and Stoica, M. and Stefan, N. and Kampylafka, V. and Aperathitis, E. and Modreanu, M. and Zaharescu, M. and Gartner, M. (2013) 'Influence of thermal treatment in N2 atmosphere on chemical, microstructural and optical properties of indium tin oxide and nitrogen doped indium tin oxide rf-sputtered thin films' Thin Solid Films, 541 :121-126.   [Details]
(2013)'Vibrational properties of SrCu2O2 studied via Density Functional Theory calculations and compared to Raman and infrared spectroscopy measurements'
Even, J. and Pedesseau, L. and Durand, O. and Modreanu, M. and Huyberechts, G. and Servet, B. and Chaix-Pluchery, O. (2013) 'Vibrational properties of SrCu2O2 studied via Density Functional Theory calculations and compared to Raman and infrared spectroscopy measurements' Thin Solid Films, 541 :113-116.   [Details]
(2013)'Special issue on current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III, E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012'
Modreanu, M. and Durand, O. and Jellison, G.E. and Salviati, G. and Fried, M. (2013) 'Special issue on current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III, E-MRS Spring 2012 - Symposium W, held in Strasbourg, France, May 14-18, 2012' Thin Solid Films, 541 :1-2.   [Details]
(2012)'Optimisation and scaling of interfacial GeO 2 layers for high-¿ gate stacks on germanium and extraction of dielectric constant of GeO 2'
Murad, S.N.A. and Baine, P.T. and McNeill, D.W. and Mitchell, S.J.N. and Armstrong, B.M. and Modreanu, M. and Hughes, G. and Chellappan, R.K. (2012) 'Optimisation and scaling of interfacial GeO 2 layers for high-¿ gate stacks on germanium and extraction of dielectric constant of GeO 2' Solid-State Electronics, 78 :136-140.   [Details]
(2012)'Influence of the substrate and nitrogen amount on the microstructural and optical properties of thin r.f.-sputtered ZnO films treated by rapid thermal annealing'
Nicolescu, M. and Anastasescu, M. and Preda, S. and Stroescu, H. and Stoica, M. and Teodorescu, V.S. and Aperathitis, E. and Kampylafka, V. and Modreanu, M. and Zaharescu, M. and Gartner, M. (2012) 'Influence of the substrate and nitrogen amount on the microstructural and optical properties of thin r.f.-sputtered ZnO films treated by rapid thermal annealing' Applied Surface Science, 261 :815-823.   [Details]
(2011)'Transparent p/n diode device from a single zinc nitride sputtering target'
Kambilafka, V. and Kostopoulos, A. and Androulidaki, M. and Tsagaraki, K. and Modreanu, M. and Aperathitis, E. (2011) 'Transparent p/n diode device from a single zinc nitride sputtering target' Thin Solid Films, 520 (4) :1202-1206.   [Details]
(2011)'Raman spectroscopic monitoring of the osteogenic differentiation of human mesenchymal stem cells'
McManus, L.L. and Burke, G.A. and McCafferty, M.M. and O'Hare, P. and Modreanu, M. and Boyd, A.R. and Meenan, B.J. (2011) 'Raman spectroscopic monitoring of the osteogenic differentiation of human mesenchymal stem cells' Analyst, 136 (12) :2471-2481.   [Details]
(2008)'Growth and characterisation of CaCu2Ox thin films by pulsed injection MOCVD'
Deschanvres, J.L. and Jimenez, C. and Rapenne, L. and McSporran, N. and Servet, B. and Durand, O. and Modreanu, M. (2008) 'Growth and characterisation of CaCu2Ox thin films by pulsed injection MOCVD' Thin Solid Films, 516 (7) :1461-1463.   [Details]
(2007)'Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra'
Kondilis, A. and Aperathitis, E. and Modreanu, M. (2007) 'Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra' Thin Solid Films, 515 (24 SPEC. ISS) :8586-8589.   [Details]
(2007)'Optical and microstructural properties of p-type SrCu2O2: First principles modeling and experimental studies'
Modreanu, M. and Nolan, M. and Elliott, S.D. and Durand, O. and Servet, B. and Garry, G. and Gehan, H. and Huyberechts, G. and Papadopoulou, E.L. and Androulidaki, M. and Aperathitis, E. (2007) 'Optical and microstructural properties of p-type SrCu2O2: First principles modeling and experimental studies' Thin Solid Films, 515 (24 SPEC. ISS) :8624-8631.   [Details]
(2007)'Study of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films'
Millon, C. and Deschanvres, J.L. and Jiménez, C. and Macsporran, N. and Servet, B. and Durand, O. and Modreanu, M. (2007) 'Study of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films' Surface and Coatings Technology, 201 (22-23 SPEC. ISS) :9395-9399.   [Details]
(2007)'Studies of oxide-based thin-layered heterostructures by X-ray scattering methods'
Durand, O. and Rogers, D. and Teherani, F.H. and Andrieux, M. and Modreanu, M. (2007) 'Studies of oxide-based thin-layered heterostructures by X-ray scattering methods' Thin Solid Films, 515 (16 SPEC. ISS) :6360-6367.   [Details]
(2006)'Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform'
Bridou, F. and Gautier, J. and Delmotte, F. and Ravet, M.-F. and Durand, O. and Modreanu, M. (2006) 'Thin multilayers characterization by grazing X-ray reflectometry and use of Fourier transform' Applied Surface Science, 253 (1 SPEC. ISS) :12-16.   [Details]
(2006)'Stabilization of the anatase phase in TiO2(Fe3+, PEG) nanostructured coatings'
Trapalis, C. and Gartner, M. and Modreanu, M. and Kordas, G. and Anastasescu, M. and Scurtu, R. and Zaharescu, M. (2006) 'Stabilization of the anatase phase in TiO2(Fe3+, PEG) nanostructured coatings' Applied Surface Science, 253 (1 SPEC. ISS) :367-371.   [Details]
(2010)'Properties of strontium copper oxide (SCO) deposited by PLD using the 308nm laser and formation of SCO/Si heterostructures'
Louloudakis, D. and Varda, M. and Papadopoulou, E.L. and Kayambaki, M. and Tsagaraki, K. and Kambilafka, V. and Modreanu, M. and Huyberechts, G. and Aperathitis, E. (2010) 'Properties of strontium copper oxide (SCO) deposited by PLD using the 308nm laser and formation of SCO/Si heterostructures' Physica Status Solidi (A) Applications and Materials Science, 207 (7) :1726-1730.   [Details]
(2010)'Surface topography and optical properties of nitrogen doped ZnO thin films formed by radio frequency magnetron sputtering on fused silica substrates'
Nicolescu, M. and Anastasescu, M. and Preda, S. and Calderon-Moreno, J.M. and Stroescu, H. and Gartner, M. and Teodorescu, V.S. and Maraloiu, A.V. and Kampylafka, V. and Aperathitis, E. and Modreanu, M. (2010) 'Surface topography and optical properties of nitrogen doped ZnO thin films formed by radio frequency magnetron sputtering on fused silica substrates' Journal of Optoelectronics and Advanced Materials, 12 (6) :1343-1349.   [Details]
(2010)'Investigation of microstructural properties of nitrogen doped ZnO thin films formed by magnetron sputtering on silicon substrate'
Nicolescu, M. and Anastasescu, M. and Preda, S. and Calderon-Moreno, J.M. and Osiceanu, P. and Gartner, M. and Teodorescu, V.S. and Maraloiu, A.V. and Kampylafka, V. and Aperathitis, E. and Modreanu, M. (2010) 'Investigation of microstructural properties of nitrogen doped ZnO thin films formed by magnetron sputtering on silicon substrate' Journal of Optoelectronics and Advanced Materials, 12 (5) :1045-1051.   [Details]
(2009)'Properties of n-type ZnN thin films as channel for transparent thin film transistors'
Aperathitis, E. and Kambilafka, V. and Modreanu, M. (2009) 'Properties of n-type ZnN thin films as channel for transparent thin film transistors' Thin Solid Films, 518 (4) :1036-1039.   [Details]
(2009)'Optical spectroscopy study of nc-Si-based p-i-n solar cells'
Sancho-Parramon, J. and Gracin, D. and Modreanu, M. and Gajovic, A. (2009) 'Optical spectroscopy study of nc-Si-based p-i-n solar cells' Solar Energy Materials and Solar Cells, 93 (10) :1768-1772.   [Details]
(2009)'Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices'
Himmerlich, M. and Koufaki, M. and Ecke, G. and Mauder, C. and Cimalla, V. and Schaefer, J.A. and Kondilis, A. and Pelekanos, N.T. and Modreanu, M. and Krischok, S. and Aperathitis, E. (2009) 'Effect of annealing on the properties of indium-tin-oxynitride films as ohmic contacts for GaN-based optoelectronic devices' ACS Applied Materials and Interfaces, 1 (7) :1451-1456.   [Details]
(2008)'Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation'
Cherkaoui, K. and Monaghan, S. and Negara, M.A. and Modreanu, M. and Hurley, P.K. and O'Connell, D. and McDonnell, S. and Hughes, G. and Wright, S. and Barklie, R.C. and Bailey, P. and Noakes, T.C.Q. (2008) 'Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation' Journal of Applied Physics, 104 (6) .   [Details]
(2008)'Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion'
Sancho-Parramon, J. and Modreanu, M. and Bosch, S. and Stchakovsky, M. (2008) 'Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion' Thin Solid Films, 516 (22) :7990-7995.   [Details]
(2008)'Derivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements'
Kondilis, A. and Aperathitis, E. and Modreanu, M. (2008) 'Derivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements' Thin Solid Films, 516 (22) :8073-8076.   [Details]
(2008)'Effect of chlorine doping on electrical and optical properties of ZnO thin films'
Chikoidze, E. and Nolan, M. and Modreanu, M. and Sallet, V. and Galtier, P. (2008) 'Effect of chlorine doping on electrical and optical properties of ZnO thin films' Thin Solid Films, 516 (22) :8146-8149.   [Details]
(2008)'Study of the growth and annealing conditions of SrCu 2O 2 (SCO) thin films deposited by injection MOCVD'
Deschanvres, J.L. and Millon, C. and Jimenez, C. and Khan, A. and Roussel, H. and Servet, B. and Durand, O. and Modreanu, M. (2008) 'Study of the growth and annealing conditions of SrCu 2O 2 (SCO) thin films deposited by injection MOCVD' Physica Status Solidi (A) Applications and Materials Science, 205 (8) :2013-2017.   [Details]
(2008)'Electrical properties of chlorine-doped ZnO thin films grown by MOCVD'
Chikoidze, E. and Modreanu, M. and Sallet, V. and Gorochov, O. and Galtier, P. (2008) 'Electrical properties of chlorine-doped ZnO thin films grown by MOCVD' Physica Status Solidi (A) Applications and Materials Science, 205 (7) :1575-1579.   [Details]
(2005)'LPCVD-silicon oxynitride films: Interface properties'
Halova, E. and Alexandrova, S. and Szekeres, A. and Modreanu, M. (2005) 'LPCVD-silicon oxynitride films: Interface properties' Microelectronics Reliability, 45 (5-6) :982-985.   [Details]
(2005)'Post deposition UV-induced O2 annealing of HfO2 thin films'
Fang, Q. and Liaw, I. and Modreanu, M. and Hurley, P.K. and Boyd, I.W. (2005) 'Post deposition UV-induced O2 annealing of HfO2 thin films' Microelectronics Reliability, 45 (5-6) :957-960.   [Details]
(2005)'Solid phase crystallisation of HfO2 thin films'
Modreanu, M. and Sancho-Parramon, J. and O'Connell, D. and Justice, J. and Durand, O. and Servet, B. (2005) 'Solid phase crystallisation of HfO2 thin films' Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 118 (1-3) :127-131.   [Details]
(2005)'Characterisation of room temperature blue emmiting Si/SiO2 multilayers'
Modreanu, M. and Aperathitis, E. and Androulidaki, M. and Audier, M. and Chaix-Pluchery, O. (2005) 'Characterisation of room temperature blue emmiting Si/SiO2 multilayers' Optical Materials, 27 (5) :1020-1025.   [Details]
(2005)'The influence of Cu on the morphological and chemical properties of nanostructured TiO2 films'
Gartner, M. and Ghita, A. and Anastasescu, M. and Osiceanu, P. and Dobrescu, G. and Zaharescu, M. and Macovei, D. and Modreanu, M. and Trapalis, C. and Kordas, G. (2005) 'The influence of Cu on the morphological and chemical properties of nanostructured TiO2 films' Journal of Optoelectronics and Advanced Materials, 7 (1) :401-405.   [Details]
(2004)'Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings'
Gartner, M. and Scurtu, R. and Ghita, A. and Zaharescu, M. and Modreanu, M. and Trapalis, C. and Kokkoris, M. and Kordas, G. (2004) 'Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings' Thin Solid Films, 455-456 :417-421.   [Details]
(2004)'Interface of ultrathin HfO2 films deposited by UV-photo-CVD'
Fang, Q. and Zhang, J.-Y. and Wang, Z. and Modreanu, M. and O'Sullivan, B.J. and Hurley, P.K. and Leedham, T.L. and Hywel, D. and Audier, M.A. and Jimenez, C. and Senateur, J.-P. and Boyd, I.W. (2004) 'Interface of ultrathin HfO2 films deposited by UV-photo-CVD' Thin Solid Films, 453-454 :203-207.   [Details]
(2006)'Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering'
Koufaki, M. and Sifakis, M. and Iliopoulos, E. and Pelekanos, N. and Modreanu, M. and Cimalla, V. and Ecke, G. and Aperathitis, E. (2006) 'Optical emission spectroscopy during fabrication of indium-tin-oxynitride films by RF-sputtering' Applied Surface Science, 253 (1 SPEC. ISS) :405-408.   [Details]
(2006)'Optical characterization and microstructure of BaTiO3 thin films obtained by RF-magnetron sputtering'
Ianculescu, A. and Gartner, M. and Despax, B. and Bley, V. and Lebey, Th. and Gavrila, R. and Modreanu, M. (2006) 'Optical characterization and microstructure of BaTiO3 thin films obtained by RF-magnetron sputtering' Applied Surface Science, 253 (1 SPEC. ISS) :344-348.   [Details]
(2006)'Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films'
Modreanu, M. and Sancho-Parramon, J. and Durand, O. and Servet, B. and Stchakovsky, M. and Eypert, C. and Naudin, C. and Knowles, A. and Bridou, F. and Ravet, M.-F. (2006) 'Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films' Applied Surface Science, 253 (1 SPEC. ISS) :328-334.   [Details]
(2006)'Optical characterization of InxGa1-xN alloys'
Gartner, M. and Kruse, C. and Modreanu, M. and Tausendfreund, A. and Roder, C. and Hommel, D. (2006) 'Optical characterization of InxGa1-xN alloys' Applied Surface Science, 253 (1 SPEC. ISS) :254-257.   [Details]
(2006)'Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells'
Ginige, R. and Corbett, B. and Modreanu, M. and Barrett, C. and Hilgarth, J. and Isella, G. and Chrastina, D. and Von Känel, H. (2006) 'Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells' Semiconductor Science and Technology, 21 (6) :775-780.   [Details]
(2005)'Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD'
Decams, J.M. and Guillon, H. and Jiménez, C. and Audier, M. and Sénateur, J.P. and Dubourdieu, C. and Cadix, O. and O'Sullivan, B.J. and Modreanu, M. and Hurley, P.K. and Rusworth, S. and Leedham, T.J. and Davies, H. and Fang, Q. and Boyd, I. (2005) 'Electrical characterization of HfO2 films obtained by UV assisted injection MOCVD' Microelectronics Reliability, 45 (5-6) :929-932.   [Details]
(2002)'The etching behavior of APCVD PSG thin films used as sacrificial layers for surface micromachined resonant microstructures'
Modreanu, M. and Moldovan, C. and Iosub, R. (2002) 'The etching behavior of APCVD PSG thin films used as sacrificial layers for surface micromachined resonant microstructures' Sensors and Actuators, A: Physical, 99 (1-2) :82-84.   [Details]
(2002)'Micromachining of a silicon multichannel microprobe for neural electrical activity recording'
Moldovan, C. and Ilian, V. and Constantin, Ghe. and Iosub, R. and Modreanu, M. and Dinoiu, I. and Firtat, B. and Voitincu, C. (2002) 'Micromachining of a silicon multichannel microprobe for neural electrical activity recording' Sensors and Actuators, A: Physical, 99 (1-2) :119-124.   [Details]
(2004)'X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-¿ materials'
Ferrari, S. and Modreanu, M. and Scarel, G. and Fanciulli, M. (2004) 'X-Ray reflectivity and spectroscopic ellipsometry as metrology tools for the characterization of interfacial layers in high-¿ materials' Thin Solid Films, 450 (1) :124-127.   [Details]
(2004)'Optical properties of silicon thin films related to LPCVD growth condition'
Modreanu, M. and Gartner, M. and Cobianu, C. and O'Looney, B. and Murphy, F. (2004) 'Optical properties of silicon thin films related to LPCVD growth condition' Thin Solid Films, 450 (1) :105-110.   [Details]
(2004)'Thin Soild Films: Editorial'
Modreanu, M. and Murtagh, M. and Ricote, J. and Chateigner, D. and Schreiber, J. (2004) 'Thin Soild Films: Editorial' Thin Solid Films, 450 (1) :1-2.   [Details]
(2004)'Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures'
Murtagh, M.E. and Guenebaut, V. and Ward, S. and Nee, D. and Kelly, P.V. and O'Looney, B. and Murphy, F. and Modreanu, M. and Westwater, S. and Blunt, R. and Bland, S.W. (2004) 'Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures' Thin Solid Films, 450 (1) :148-150.   [Details]
(2004)'Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering'
Aperathitis, E. and Modreanu, M. and Bender, M. and Cimalla, V. and Ecke, G. and Androulidaki, M. and Pelekanos, N. (2004) 'Optical characterization of indium-tin-oxynitride fabricated by RF-sputtering' Thin Solid Films, 450 (1) :101-104.   [Details]
(2003)'Silicon micromachined sensor for gas detection'
Moldovan, C. and Hinescu, L. and Hinescu, M. and Iosub, R. and Nisulescu, M. and Firtat, B. and Modreanu, M. and Dascalu, D. and Voicu, V. and Tarabasanu, C. (2003) 'Silicon micromachined sensor for gas detection' Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 101 (1-3) :227-231.   [Details]
(2003)'Properties of rf-sputtered indium-tin-oxynitride thin films'
Aperathitis, E. and Bender, M. and Cimalla, V. and Ecke, G. and Modreanu, M. (2003) 'Properties of rf-sputtered indium-tin-oxynitride thin films' Journal of Applied Physics, 94 (2) :1258-1266.   [Details]
(2003)'Investigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices'
Modreanu, M. and Gartner, M. and Aperathitis, E. and Tomozeiu, N. and Androulidaki, M. and Cristea, D. and Hurley, P. (2003) 'Investigation on preparation and physical properties of nanocrystalline Si/SiO2 superlattices for Si-based light-emitting devices' Physica E: Low-Dimensional Systems and Nanostructures, 16 (3-4) :461-466.   [Details]
(2002)'LPCVD-silicon oxynitride films: Low-temperature annealing effects'
Alexandrova, S. and Szekeres, A. and Halova, E. and Modreanu, M. (2002) 'LPCVD-silicon oxynitride films: Low-temperature annealing effects' User Modeling and User-Adapted Interaction, 69 (1-3) :385-389.   [Details]
(2002)'On the structure, morphology and electrical conductivities of titanium oxide thin films'
Mardare, D. and Baban, C. and Gavrila, R. and Modreanu, M. and Rusu, G.I. (2002) 'On the structure, morphology and electrical conductivities of titanium oxide thin films' Surface Science, 507-510 :468-472.   [Details]
(2002)'Microstructural information from optical properties of LPCVD silicon films annealed at low temperature'
Gartner, M. and Modreanu, M. and Cobianu, C. and Gavrila, R. and Danila, M. (2002) 'Microstructural information from optical properties of LPCVD silicon films annealed at low temperature' Sensors and Actuators, A: Physical, 99 (1-2) :160-164.   [Details]
(2002)'Silicon membranes fabrication by wet anisotropic etching'
Iosub, R. and Moldovan, C. and Modreanu, M. (2002) 'Silicon membranes fabrication by wet anisotropic etching' Sensors and Actuators, A: Physical, 99 (1-2) :104-111.   [Details]
(2002)'Investigation on preparation and physical properties of LPCVD SixOyNz thin films and nanocrystalline Si/SixOyNz superlattices for Si-based light emitting devices'
Modreanu, M. and Gartner, M. and Cristea, D. (2002) 'Investigation on preparation and physical properties of LPCVD SixOyNz thin films and nanocrystalline Si/SixOyNz superlattices for Si-based light emitting devices' Materials Science and Engineering C, 19 (1-2) :225-228.   [Details]
(2001)'Elimination of silicon hillocks using an alkaline complexant etching system'
Moldovan, C. and Iosub, R. and Modreanu, M. (2001) 'Elimination of silicon hillocks using an alkaline complexant etching system' International Journal of Inorganic Materials, 3 (8) :1173-1176.   [Details]
(2001)'Capacitance-Voltage Characterization of LPCVD-Silicon Oxynitride Films'
Szekeres, A. and Alexandrova, S. and Modreanu, M. (2001) 'Capacitance-Voltage Characterization of LPCVD-Silicon Oxynitride Films' Physica Status Solidi (A) Applied Research, 187 (2) :493-498.   [Details]
(2001)'Photonic circuits integrated with CMOS compatible photodetectors'
Cristea, D. and Craciunoiu, F. and Modreanu, M. and Caldararu, M. and Cernica, I. (2001) 'Photonic circuits integrated with CMOS compatible photodetectors' Optical Materials, 17 (1-2) :201-205.   [Details]
(2001)'Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films'
Modreanu, M. and Gartner, M. and Tomozeiu, N. and Seekamp, J. and Cosmin, P. (2001) 'Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films' Optical Materials, 17 (1-2) :145-148.   [Details]
(2001)'Investigation on optical properties of CVD films used in MOEMS applications'
Modreanu, M. and Gartner, M. (2001) 'Investigation on optical properties of CVD films used in MOEMS applications' Journal of Molecular Structure, 565-566 :519-523.   [Details]
(2001)'Optical and electrical properties of LPCVD silicon oxynitride films on silicon'
Szekeres, A. and Alexandrova, S. and Modreanu, M. and Cosmin, P. and Gartner, M. (2001) 'Optical and electrical properties of LPCVD silicon oxynitride films on silicon' Vacuum, 61 (2-4) :205-209.   [Details]
(2001)'Physical properties of polycrystalline silicon films related to LPCVD conditions'
Modreanu, M. and Bercu, M. and Cobianu, C. (2001) 'Physical properties of polycrystalline silicon films related to LPCVD conditions' Thin Solid Films, 383 (1-2) :212-215.   [Details]
(2001)'Microstructural and optical properties of as-deposited LPCVD silicon films'
Modreanu, M. and Tomozeiu, N. and Gartner, M. and Cosmin, P. (2001) 'Microstructural and optical properties of as-deposited LPCVD silicon films' Thin Solid Films, 383 (1-2) :254-257.   [Details]
(1999)'Optical characterization of dielectric borophosphosilicate glass'
Gartner, M. and Modreanu, M. and Bosch, S. and Stoica, T. (1999) 'Optical characterization of dielectric borophosphosilicate glass' Microelectronics Reliability, 40 (4-5) :617-620.   [Details]
(1999)'Optical properties of LPCVD silicon oxynitride'
Modreanu, M. and Tomozeiu, N. and Cosmin, P. and Gartner, M. (1999) 'Optical properties of LPCVD silicon oxynitride' Thin Solid Films, 337 (1-2) :82-84.   [Details]
(2006)'Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells'
Ginige, R and Corbett, B and Modreanu, M and Barrett, C and Hilgarth, J and Isella, G and Chrastina, D and von K\"anel, H (2006) 'Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells' Semiconductor science and technology, 21 . [Details]
(2011)'Investigation of bulk defects in amorphous and crystalline HfO< sub> 2 thin films'
Modreanu, M and Monaghan, S and Povey, IM and Cherkaoui, K and Hurley, PK and Androulidaki, M (2011) 'Investigation of bulk defects in amorphous and crystalline HfO< sub> 2 thin films' Microelectronic Engineering, 88 (7) :1499-1502. [Details]
(2007)'Optical and microstructural properties of p-type SrCu< sub> 2 O< sub> 2: First principles modeling and experimental studies'
Modreanu, M and Nolan, M and Elliott, SD and Durand, O and Servet, B and Garry, G and Gehan, H and Huyberechts, G and Papadopoulou, EL and Androulidaki, M and others (2007) 'Optical and microstructural properties of p-type SrCu< sub> 2 O< sub> 2: First principles modeling and experimental studies' Thin Solid Films, 515 (24) :8624-8631. [Details]

Professional Activities

Honours and Awards

 YearTitleAwarding Body
2011Best Paper Award 34th International Semiconductor Conference

Professional Associations

 AssociationFunctionFrom / To
European Material Research Society Board Member14-MAY-12 / 01-JUN-15

Employment

 EmployerPositionFrom / To
National Institute for Microtechnologies, IMT-Bucharest, Romania Senior Researcher01-SEP-93 / 20-JAN-02

Education

 YearInstitutionQualificationSubject
1993University of Bucharest, Romania MASTERS IN PHYSICSPhysics
2002University of Bucharest, Romania Ph.D.Physics

Languages

 LanguageReadingWritingSpeaking
French FluentFunctionalFluent
English FluentFluentFluent
Romanian FluentFluentFluent

Journal Activities

 JournalRoleTo / From
Thin Solid Films Guest Editor-
Journal Of Physics D: Applied Physics Referee-
Applied Physics Letters Referee-
Appl Surf Sci Referee-
Physical Chemistry Chemical Physics Referee-
Analyst Referee-
Crystengcomm Referee-
Energy & Environmental Science Referee-
Phys Status Solidi-R Referee-
Opt Mater Referee-
Chemphyschem Referee-

Research Information

External Collaborators

 NameOrganisation/ InstitutionCountry
Dr. Guy Garry Thales R&TFRANCE
Dr. G.E.Jellison Oak Ridge National LaboratoryU.S.A.
Dr. Carmen Jimenez INPG-LMGPFRANCE
Dr Mariuca Gartner Institul de Chimie Fizica I.G.Murgulescu al Academiei RomaneROMANIA
Prof. Yve Dumont University of VersaillesFRANCE
Dr. Bernard Servet Thales R&TFRANCE
Dr. Afshin Ziaei Thales R&TFRANCE
Prof. Olivier Durand INSA RennesFRANCE

Contact details

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School of Biological, Earth and Environmental Sciences

An Scoil Eolaíochtaí Bitheolaíocha, Domhaneolaíocha agus Comhshaoil

University College Cork, Distillery Fields, North Mall, Cork, Ireland T23 N73K

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