Research Profile

Russell Duane

Biography

Dr. Duane has worked on a number of research projects in collaboration with industrial partners and has acted as a consultant in the area of semiconductor devices for a number of indigenous and multinational companies. He has been issued three U.S. patents in the area of semiconductor devices. Two of these patents were the outcome of an industrial collaboration with Bourns to investigate new over-voltage protection devices. Another patent on a novel memory device was issued as a result of his Ph.D. work. 
Dr. Duane currently leads an SFI funded research programme in the area of dielectric charging for MEMS devices. One of the papers from this programme was chosen last year by the Editors of Applied Physics Letters to be included in special edition Editor's Choice 2012 which represents the best research across the entire journal. He is also currently responsible for improving the performance of the Tyndall RADFET technology and has already significantly increased production yield and is currently investigating two novel device structures to increase sensitivity. He has published a number of articles in refereed journals and conference proceedings. 

Research Grants

 ProjectFunding
Body
Start DateEnd DateAward
EI Yield Enhancement Silicon overvoltage/overcurrent technology for ultra-low voltage mediam speedEnterprise Irl15-DEC-0715-DEC-08€96,307.00
Littlefuse - New Product DevelopmentForeign Industry01-MAR-0631-DEC-06€30,700.00
Dielectric charging in capacitive MEMS devices in irradiating environment.Irish Research Council for Science, Engineering & Technology (IRCSET)01-JUL-1001-JUN-13€83,616.00
SFI 10/RFP/ECE2883 ; Study of Dielectric Charging in Capactive MEMS SwtichesScience Foundation of Ireland01-JUL-1031-DEC-15€172,730.00
[EU Contract No. 506844]{Duane Dr. R} VEuropean Union01-JAN-0431-DEC-06€246,036.00
[IRCSET SC/02/198] {Duane, Dr.R.} NIrish Research Council for Science, Engineering & Technology (IRCSET)01-OCT-0230-SEP-05€140,225.00
[IF/2002/022]{Dr.Russell Duane} NEnterprise Irl01-JUL-0230-JUN-04€183,900.00
EI PC/2007/006Enterprise Irl02-MAY-0702-JUL-08€98,126.00

Publications

Peer Reviewed Journals

 YearPublication
(2014)'A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches'
Ryan, C,Olszewski, Z,Houlihan, R,O'Mahony, C,Duane, R (2014) 'A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches'. Applied Physics Letters, 104 [DOI] [Details]
(2013)'Radiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals'
Arima, V,Pascali, G,Lade, O,Kretschmer, HR,Bernsdorf, I,Hammond, V,Watts, P,De Leonardis, F,Tarn, MD,Pamme, N,Cvetkovic, BZ,Dittrich, PS,Vasovic, N,Duane, R,Jaksic, A,Zacheo, A,Zizzari, A,Marra, L,Perrone, E,Salvadori, PA,Rinaldi, R (2013) 'Radiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals'. Lab On A Chip, 13 :2328-2336 [DOI] [Details]
(2012)'Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches'
Olszewski, Z,Houlihan, R,Ryan, C,O'Mahony, C,Duane, R (2012) 'Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches'. Applied Physics Letters, 100 [DOI] [Details]
(2012)'Addendum:“A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches”[Appl. Phys. Lett. 93, 094101 (2008)]'
Olszewski, Z.,Houlihan, R.,O’Mahony, C.,Duane, R. (2012) 'Addendum:“A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches”[Appl. Phys. Lett. 93, 094101 (2008)]'. Applied Physics Letters, 100 (22):29903-29903 [Details]
(2011)'Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 degrees C'
O'Mahony, D,Duane, R,Campagno, T,Lewis, L,Cordero, N,Maaskant, P,Waldron, F,Corbett, B (2011) 'Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 degrees C'. Microelectronics Reliability, 51 :904-908 [DOI] [Details]
(2010)'Investigation of Back-Bias Capacitance Coupling Coefficient Measurement Methodology for Floating-Gate Nonvolatile Memory Cells'
Beug, MF,Rafhay, Q,van Duuren, MJ,Duane, R (2010) 'Investigation of Back-Bias Capacitance Coupling Coefficient Measurement Methodology for Floating-Gate Nonvolatile Memory Cells'. IEEE Transactions On Electron Devices, 57 :1253-1260 [DOI] [Details]
(2010)'LDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide'
Yan, R,Duane, R,Razavi, P,Afzalian, A,Ferain, I,Lee, CW,Akhavan, ND,Nguyen, BY,Bourdelle, KK,Colinge, JP; (2010) 'LDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide'. IEEE Transactions On Electron Devices, 57 :1319-1326 [DOI] [Details]
(2009)'Comment on Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches [Appl. Phys. Lett. 92, 043502 (2008)]'
Olszewski, Z.,O'Mahony, C.,Houlihan, R.,Duane, R. (2009) 'Comment on Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches [Appl. Phys. Lett. 92, 043502 (2008)]'. Applied Physics Letters, 95 (1717)   [Details]
(2008)'A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches'
Olszewski, Z.,Duane, R.,O'Mahony, C. (2008) 'A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches'. Applied Physics Letters, 93 (99)   [Details]
(2007)'Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods'
Rafhay, Q,Beug, MF,Duane, R (2007) 'Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods'. Solid-State Electronics, 51 :585-592 [DOI] [Details]
(2007)'Investigation into the effect that probe immobilisation method type has on the analytical signal of an EIS DNA biosensor'
Lillis, B,Manning, M,Hurley, E,Berney, H,Duane, R,Mathewson, A,Sheehan, MM; (2007) 'Investigation into the effect that probe immobilisation method type has on the analytical signal of an EIS DNA biosensor'. Biosensors & Bioelectronics, 22 :1289-1295 [DOI] [Details]
(2007)'Measurement and. analysis of PD-SOI static latches based on bistable-gated-bipolar device'
Cheng, X,Duane, R; (2007) 'Measurement and. analysis of PD-SOI static latches based on bistable-gated-bipolar device'. IEEE Journal of Solid-State Circuits, 42 :2585-2593 [DOI] [Details]
(2007)'Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor'
Duane, R, Rafhay, Q, Beug, MF, van Duuren, M; (2007) 'Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor'. IEEE Electron Device Letters, 28 (5):440-442 [DOI] [Details]
(2007)'Intrinsic mismatch between floating-gate nonvolatile memory cell and equivalent transistor'
Duane, R,Rafhay, Q,Beug, MF,van Duuren, M; (2007) 'Intrinsic mismatch between floating-gate nonvolatile memory cell and equivalent transistor'. IEEE Electron Device Letters, 28 :440-442 [DOI] [Details]
(2007)'Investigation Into The Effect That Probe Immobilisation Method Type Has On The Analytical Signal of An Eis Dna Biosensor'
Lillis, B, Manning, M, Hurley, E, Berney, H, Duane, R, Mathewson, A, Sheehan, MM; (2007) 'Investigation Into The Effect That Probe Immobilisation Method Type Has On The Analytical Signal of An Eis Dna Biosensor'. Biosensors & Bioelectronics, 22 (7):1289-1295 [DOI] [Details]
(2006)'0.6V D flip-flop utilising negative differential resistance device'
Cheng, X,Duane, R; (2006) '0.6V D flip-flop utilising negative differential resistance device'. Electronic Letters, 42 :388-390 [DOI] [Details]
(2006)'A Comprehensive Study of Bistable Gated Bipolar Device'
Cheng, X, Duane, R; (2006) 'A Comprehensive Study of Bistable Gated Bipolar Device'. IEEE Transactions On Electron Devices, 53 (10):2589-2597 [DOI] [Details]
(2005)'Low-voltage micromechanical test structures for measurement of residual charge in dielectrics'
O'Mahony, C,Duane, R,Hill, M,Mathewson, A (2005) 'Low-voltage micromechanical test structures for measurement of residual charge in dielectrics'. Electronics Letters, 41 :409-411 [Details]
(2005)'Two D flip-flops based on bistable-gated-bipolar devices'
Cheng, X,Duane, R,Mathewson, A; (2005) 'Two D flip-flops based on bistable-gated-bipolar devices'. Electronic Letters, 41 :305-306 [DOI] [Details]
(2005)'Low-voltage micromechanical test structures for measurement of residual charge in dielectrics'
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2005) 'Low-voltage micromechanical test structures for measurement of residual charge in dielectrics'. Electronics Letters, 41 (77):409-411409   [Details]
(2005)'Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC)'
Olszewski, Z,Hilll, M,O'Mahony, C,Duane, R,Houlihan, R (2005) 'Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC)'. Journal of Micromechanics and Microengineering, 15 :122-131 [DOI] [Details]
(2005)'Novel capacitance coupling coefficient measurement methodology for floating gate nonvolatile memory devices'
Duane, R,Beug, MF,Mathewson, A; (2005) 'Novel capacitance coupling coefficient measurement methodology for floating gate nonvolatile memory devices'. IEEE Electron Device Letters, 26 :507-509 [DOI] [Details]
(2005)'Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC)'
Olszewski, Z.,Hilll, M.,O'Mahony, C.,Duane, R.,Houlihan, R. (2005) 'Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC)'. Journal of Micromechanics and Microengineering, 15 (77)   [Details]
(2003)'Improving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size'
MacSweeney,D.; McCarthy,K.G.; Floyd,L.; Duane,R.; Hurley, P.; Power, J.A.; Kelly, S.C.; Mathewson, A.; (2003) 'Improving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size'. IEEE Transactions on Semiconductor Manufacturing, 16 (2):207-214 [Details]
(2003)'Analysis of electromechanical boundary effects on the pull-in of micromachined fixed-fixed beams'
O'Mahony, C,Hill, M,Duane, R,Mathewson, A (2003) 'Analysis of electromechanical boundary effects on the pull-in of micromachined fixed-fixed beams'. Journal of Micromechanics and Microengineering, 13 :75-80 [Details]
(2003)'Characterization of micromechanical structures using white-light interferometry'
O'Mahony, C,Hill, M,Brunet, M,Duane, R,Mathewson, A (2003) 'Characterization of micromechanical structures using white-light interferometry'. Measurement Science &Technology, 14 :1807-1814 [Details]
(2003)'Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams'
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2003) 'Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams'. Journal of Micromechanics and Microengineering, 13 [Details]
(2003)'Improving the accuracy and efficiency of junction capacitance characterization: Strategies for probing configuration and data set size'
MacSweeney, D,McCarthy, KG,Floyd, L,Duane, R,Hurley, P,Power, JA,Kelly, SC,Mathewson, A (2003) 'Improving the accuracy and efficiency of junction capacitance characterization: Strategies for probing configuration and data set size'. IEEE Transactions on Semiconductor Manufacturing, 16 :207-214 [DOI] [Details]
(2003)'Compact model development for a new nonvolatile memory cell architecture'
O'Shea, M,Duane, R,McCarthy, D,McCarthy, KG,Concannon, A,Mathewson, A (2003) 'Compact model development for a new nonvolatile memory cell architecture'. IEEE Transactions on Semiconductor Manufacturing, 16 :215-219 [DOI] [Details]
(2003)'A novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications'
Mc Carthy, D., Duane, R., O'Shea, M., Duffy, R., Mc Carthy, K., Kelliher, A.-M., Concannon, A., Mathewson, A. (2003) 'A novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications'. IEEE Transactions On Electron Devices, 50 (7):1708-1711   [Details]
(2003)'Performance and reliability of post-CMOS metal/oxide MEMS for RF application'
Hill, M,O' Mahony, C,Duane, R,Mathewson, A (2003) 'Performance and reliability of post-CMOS metal/oxide MEMS for RF application'. Journal of Micromechanics and Microengineering, 13 :131-138 [Details]
(2003)'Bistable gated bipolar device'
Duane, R,Mathewson, A,Concannon, A; (2003) 'Bistable gated bipolar device'. IEEE Electron Device Letters, 24 :661-663 [DOI] [Details]
(2003)'Compact Model Development for a New Non-Volatile Memory Cell Architecture'
O'Shea,M.; Duane,R.; McCarthy,D.; McCarthy,K.G.; Concannon,A.; Mathewson,A.; (2003) 'Compact Model Development for a New Non-Volatile Memory Cell Architecture'. IEEE Transactions on Semiconductor Manufacturing, 16 (2):215-219 [Details]
(2001)'Extraction of coupling ratios for Fowler-Nordheim programming conditions'
Duane, R,Concannon, A,O'Sullivan, P,O'Shea, M,Mathewson, A; (2001) 'Extraction of coupling ratios for Fowler-Nordheim programming conditions'. Solid-State Electronics, 45 :235-242 [Details]
(2000)'Design for reliability'
Minehane, S,Duane, R,O'Sullivan, P,McCarthy, KG,Mathewson, A (2000) 'Design for reliability'. Microelectronics Reliability, 40 :1285-1294 [Details]
(2000)'Design for Reliability'
Minehane,S.; Duane,R.; O'Sullivan,P.; McCarthy,K.G.; Mathewson,A.; (2000) 'Design for Reliability'. Microelectronics and Reliability, 40 (8-10):1285-1294 [Details]
(1999)'Modelling and simulation of reliability for design'
Mathewson, A,O'Sullivan, P,Concannon, A,Foley, S,Minehane, S,Duane, R,Palser, K (1999) 'Modelling and simulation of reliability for design'. Microelectronic Engineering, 49 :95-117 [Details]
(1998)'Dependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection'
Martin, A,Duane, R,O'Sullivan, P,Mathewson, A (1998) 'Dependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection'. Microelectronics and Reliability, 38 :1091-1096 [Details]

Conference Publications

 YearPublication
(2014)9th ESA Round Table on MNT for Space Applications
Houlihan, R.,Duane, R.,Ryan, C.,O'Mahony, C.,Olszewski, O. Z. (2014) MEMS Technology for SPACE applications at Tyndall National Institute 9th ESA Round Table on MNT for Space Applications Lausanne, SwitzerlandLausanne, Switzerland, [Details]
(2003)Micromechanics Europe 2003
O'Mahony, C.,Hill, M.,Duane, R.,Kelleher, AM,Mathewson, A. (2003) Effects of dielectric charging on the reliability of capacitive microswitches Micromechanics Europe 2003 Delft, NetherlandsDelft, Netherlands, , pp.151-155151 [Details]
(2012)Design, Test, Integration and Packaging of MEMS/MOEMS - DTIP 2012
Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Ryan, C. ,Duane, R. (2012) Experimental MEMS capacitive switch with stable actuation voltage over a broad temperature range Design, Test, Integration and Packaging of MEMS/MOEMS - DTIP 2012 Cannes, FranceCannes, France, [Details]
(2012)8th ESA Round-Table on MNT for Space Applications
Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C. ,Ryan, C. ,Duane, R. (2012) Isolation of Degradation Mechanisms in Capacitive Microelectromechanical Switches 8th ESA Round-Table on MNT for Space Applications Noordwijk, NetherlandsNoordwijk, Netherlands, [Details]
(2012)Royal Irish Academy Communications and Radio Science Colloquium
Ryan, C. ,Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Duane, R. (2012) Design For Reliability in RF MEMS Capacitive Switches Royal Irish Academy Communications and Radio Science Colloquium Dublin, IrelandDublin, Ireland, [Details]
(2009)Micromechanics Europe 2009
Houlihan, R.,Olszewski, O. Z.,Duane, R.,O'Mahony, C.,Collins, P.,Mathewson, A. (2009) System-Level Reliability of a Capacitive MEMS Switch Micromechanics Europe 2009 Toulouse, FranceToulouse, France, [Details]
(2008)MEMSWAVE 2008
Olszewski, O. Z.,Duane, R.,O'Mahony, C. (2008) Effect of Environmental Humidity on the C-V Characteristics of RF MEMS capacitive Switch MEMSWAVE 2008 Heraklion, CreteHeraklion, Crete, [Details]
(2008)Intel Ireland Research Conference
Olszewski, O. Z.,Duane, R.,O'Mahony, C. (2008) C-V Characteristic Instability of RF MEMS capacitive Switch Intel Ireland Research Conference Kildare, IrelandKildare, Ireland, [Details]
(2007)MicroNanoReliability 2007
Olszewski, O. Z.,O'Mahony, C.,Duane, R.,Hill, M. (2007) The Role of Surface Roughness in RF MEMS Capacitive Switches MicroNanoReliability 2007 Berlin, GermanyBerlin, Germany, , pp.55-5855 [Details]
(2004)Micromechanics Europe 2004
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2004) A long lifetime, low voltage, capacitive RF microswitch Micromechanics Europe 2004 Leuven, BelgiumLeuven, Belgium, , pp.237-240237 [Details]
(2004)Workshop on Dielectrics in Microelectronics
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2004) Reliable Dielectrics for Micromachined RF Switches Workshop on Dielectrics in Microelectronics Kinsale, IrelandKinsale, Ireland, [Details]
(2004)Micromechanics Europe 2004
Olszewski, O. Z.,Hill, M.,O'Mahony, C.,Duane, R. (2004) Characterisation of CMOS Integrated Multielectrode Tunable Capacitor Micromechanics Europe 2004 Leuven, BelgiumLeuven, Belgium, , pp.229-232229 [Details]
(2002)MIGAS Summer School 2002
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2002) Titanium-based Microswitches MIGAS Summer School 2002 Grenoble, FranceGrenoble, France, [Details]
(2002)International Conference on Microelectronic Test Structures (ICMTS 2002)
O'Shea,M.; McCarthy,D.; Duane,R.; McCarthy,K.G.; Concannon,A.; Mathewson,A.; (2002) Compact Model Development for a New Non-Volatile Memory Cell Architecture . In: Walton,A.J.; Mathewson, A eds. International Conference on Microelectronic Test Structures (ICMTS 2002) Cork, Ireland, , 08-APR-02 - 11-APR-02 , pp.151-156 [Details]
(2014)MEMSWAVE
Ryan, C.,Olszewski, O. Z.,Houlihan, R.,O'Mahony, C.,Blake, A.,Duane, R. (2014) Investigation of Bipolar Dielectric Charging in RF MEMS Capacitive Switches MEMSWAVE La Rochelle, FranceLa Rochelle, France, [Details]
(2003)Proceedings of SPIE - The International Society for Optical Engineering
Mathewson, A.; Duane, R.; Wrixon, G. T.; (2003) CMOS compatible avalanche photodiode (APD) arrays . In: * eds. Proceedings of SPIE - The International Society for Optical Engineering CMOS Compatible Avalanche Photodiode (APD) Arrays [B2723], , 01-JAN-03 - 30-DEC-99 , pp.378-387 [Details]
(2010)7th ESA Round Table on MNT for Space Applications
Olszewski, Z.,O'Mahony, C.,Houlihan, R.,Duane, R. (2010) A Novel charging Concept in Capacitive RF MEMS 7th ESA Round Table on MNT for Space Applications Noordwijk, The NetherlandsNoordwijk, The Netherlands, [Details]
(2005)Intel Ireland Research Conference
Olszewski, O. Z.,O'Mahony, C.,Duane, R. (2005) Reliability of MEMS-based Capacitive RF Switches Intel Ireland Research Conference Kildare, IrelandKildare, Ireland, [Details]
(2002)International Conference on Microelectronic Test Structures (ICMTS 2002)
McCarthy,D.; O’Shea,M.; Duane,R. McCarthy,K.G.; Concannon,A,; Mathewson,A.; (2002) Extraction of Coupling Coefficients for the Top-Floating-Gate (TFG) Flash EEPROM Cell . In: Walton, A.J,; Mathewson,A eds. International Conference on Microelectronic Test Structures (ICMTS 2002) Cork, Ireland, , 08-APR-02 - 11-APR-02 , pp.139-144 [Details]
(2013)Micromechanics Europe 2013
Ryan, C.,Olszewski, Z.,Houlihan, R.,O’Mahony, C.,Duane, R. (2013) Tether Design for Radio-Frequency Capacitive Switches Micromechanics Europe 2013 Helsinki, FinlandHelsinki, Finland, [Details]
(2004)IEEE Design, Test, Integration and Packaging of MEMS (DTIP) 2004
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2004) Electromechanical Modelling of Low-Voltage RF MEMS Switches IEEE Design, Test, Integration and Packaging of MEMS (DTIP) 2004 Montreux, SwitzerlandMontreux, Switzerland, , pp.277-282277 [Details]
(2012)RAD2012: The First International Conference on Radiation and Dosimetry in Various Fields of Research
Ryan, C. ,Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Duane, R. (2012) Capacitive Microelectromechanical Switches for Space Applications RAD2012: The First International Conference on Radiation and Dosimetry in Various Fields of Research Nis, SerbiaNis, Serbia, [Details]

Professional Activities

Patents

 Patent NumberTitleGranted
6,603,155overvoltage protection device 05-AUG-03
6,639,253overvoltage protection device 28-OCT-03
6310799A negative resistance device 30-OCT-01

Journal Activities

 JournalRoleTo / From
Ieee Electron Device Letters Referee-
Ieee Transactions On Electron Devices Referee-
Journal Of Applied Physics Referee-

Other Activities

 Description

Reviewer of proposals in the area of flash memory for Flemish government.

Teaching Activities

Current Postgraduate Students

 StudentDegree Type
Ryan Cormac Gerard Doctoral Degree (Structured)

Contact details

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