Electrical characterization of bismuth sulfide nanowire arrays by conductive atomic force microscopy

Typeset version

 

TY  - JOUR
  - Birjukovs, P.; Petkov, N.; Xu, J.; Svirksts, J.; Boland, J. J.; Holmes, J. D.; Erts, D.
  - 2008
  - January
  - Journal of Physical Chemistry C
  - Electrical characterization of bismuth sulfide nanowire arrays by conductive atomic force microscopy
  - Published
  - ()
  - 112
  - 19680
  - 19685
  - http://pubs.acs.org/journal/jpccck
DA  - 2008/01
ER  - 
@article{V22017839,
   = {Birjukovs, P. and  Petkov, N. and  Xu, J. and  Svirksts, J. and  Boland, J. J. and  Holmes, J. D. and  Erts, D.},
   = {2008},
   = {January},
   = {Journal of Physical Chemistry C},
   = {Electrical characterization of bismuth sulfide nanowire arrays by conductive atomic force microscopy},
   = {Published},
   = {()},
   = {112},
  pages = {19680--19685},
   = {http://pubs.acs.org/journal/jpccck},
  source = {IRIS}
}
AUTHORSBirjukovs, P.; Petkov, N.; Xu, J.; Svirksts, J.; Boland, J. J.; Holmes, J. D.; Erts, D.
YEAR2008
MONTHJanuary
JOURNAL_CODEJournal of Physical Chemistry C
TITLEElectrical characterization of bismuth sulfide nanowire arrays by conductive atomic force microscopy
STATUSPublished
TIMES_CITED()
SEARCH_KEYWORD
VOLUME112
ISSUE
START_PAGE19680
END_PAGE19685
ABSTRACT
PUBLISHER_LOCATION
ISBN_ISSN
EDITION
URLhttp://pubs.acs.org/journal/jpccck
DOI_LINK
FUNDING_BODY
GRANT_DETAILS