TY  - CONF
  - Erts, D.; Olin, H.; Polyakov, B.; Ryen, L.; Olsson, E.; Holmes, J. D.
  - Proceedings of 15th Inter. Congr. on Electron Microscopy
  - Conductive and Mechanical Properties of Silicon Nanowires Investigated in situ by TEM-SPM
  - 2002
  - January
  - Validated
  - 1
  - ()
  - Durban, South Africa
DA  - 2002/01
ER  - 

@inproceedings{V22017922,
   = {Erts, D. and  Olin, H. and  Polyakov, B. and  Ryen, L. and  Olsson, E. and  Holmes, J. D.},
   = {Proceedings of 15th Inter. Congr. on Electron Microscopy},
   = {{Conductive and Mechanical Properties of Silicon Nanowires Investigated in situ by TEM-SPM}},
   = {2002},
   = {January},
   = {Validated},
   = {1},
   = {()},
   = {Durban, South Africa},
  source = {IRIS}
}