TY  - CONF
  - Erts, D.; Saks, E.; Holmes, J. D.; Olin, H.
  - Proceedings of International Workshop on Processing and Characterisation of Nanomaterials
  - Metallic and semiconducting nanowires: properties and architectures
  - 2003
  - January
  - Validated
  - 1
  - ()
  - 8
  - Warsaw, Poland
DA  - 2003/01
ER  - 

@inproceedings{V22017940,
   = {Erts, D. and  Saks, E. and  Holmes, J. D. and  Olin, H.},
   = {Proceedings of International Workshop on Processing and Characterisation of Nanomaterials},
   = {{Metallic and semiconducting nanowires: properties and architectures}},
   = {2003},
   = {January},
   = {Validated},
   = {1},
   = {()},
  pages = {8},
   = {Warsaw, Poland},
  source = {IRIS}
}