TY  - CONF
  - Erts, D.; Polyakov, B.; Lõhmus, A.; Lõhmus, R.; Olin, H.; Holmes, J. D.
  - Proceedings of the Scanning Probe Microscopy International workshop
  - Properties of metallic and semiconducting nanowires studied by TEM-SPM
  - 2003
  - January
  - Validated
  - 1
  - ()
  - Nizhny Novgorod, Russia
DA  - 2003/01
ER  - 

@inproceedings{V22017942,
   = {Erts, D. and  Polyakov, B. and  Lõhmus, A. and  Lõhmus, R. and  Olin, H. and  Holmes, J. D.},
   = {Proceedings of the Scanning Probe Microscopy International workshop},
   = {{Properties of metallic and semiconducting nanowires studied by TEM-SPM}},
   = {2003},
   = {January},
   = {Validated},
   = {1},
   = {()},
   = {Nizhny Novgorod, Russia},
  source = {IRIS}
}