Phase Noise Comparative Analyses of LC Oscillators in 28 nm CMOS Technology through the Impulse Sensitivity Function

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TY  - CONF
  - I. Chlis, D. Pepe and D. Zito
  - Ph.D. Research In Microelectronics and Electronics (PRIME) Conference 2013
  - Phase Noise Comparative Analyses of LC Oscillators in 28 nm CMOS Technology through the Impulse Sensitivity Function
  - 2013
  - June
  - Published
  - 1
  - ()
  - IEEE
DA  - 2013/06
ER  - 
@inproceedings{V276586243,
   = {I. Chlis, D. Pepe and D. Zito},
   = {Ph.D. Research In Microelectronics and Electronics (PRIME) Conference 2013},
   = {{Phase Noise Comparative Analyses of LC Oscillators in 28 nm CMOS Technology through the Impulse Sensitivity Function}},
   = {2013},
   = {June},
   = {Published},
   = {1},
   = {()},
   = {IEEE },
  source = {IRIS}
}
AUTHORSI. Chlis, D. Pepe and D. Zito
TITLEPh.D. Research In Microelectronics and Electronics (PRIME) Conference 2013
PUBLICATION_NAMEPhase Noise Comparative Analyses of LC Oscillators in 28 nm CMOS Technology through the Impulse Sensitivity Function
YEAR2013
MONTHJune
STATUSPublished
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