TY  - CONF
  - McCarthy, K.G., Klaassen, D.B.M., van Langevelde, R., Scholten, A.J., Tiemeijer, L.F., Havens, R.J
  - Short Course at IEEE International Conference on Microelectronic Test Structures 2004 (ICMTS)
  - "RF Modeling of MOSFETs"
  - Awaji
  - Oral Presentation
  - 2004
  - ()
  - 01-MAR-04
  - 01-MAR-04
DA  - 2004/NaN
ER  - 

@unpublished{V27381753,
   = {McCarthy,  K.G. and  Klaassen,  D.B.M. and  van Langevelde,  R. and  Scholten,  A.J. and  Tiemeijer,  L.F. and  Havens,  R.J },
   = {Short Course at IEEE International Conference on Microelectronic Test Structures 2004 (ICMTS)},
   = {{"RF Modeling of MOSFETs"}},
   = {Awaji},
   = {Oral Presentation},
   = {2004},
   = {()},
  month = {Mar},
   = {01-MAR-04},
  source = {IRIS}
}