TY  - CONF
  - Chen, Wenbin and McCarthy, KG and Copuroglu, M and O'Brien, S and Winfield, R and Mathewson, A
  - Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on
  - Electrical characterization of novel PMNT thin-films
  - 2010
  - January
  - Validated
  - ()
  - 98
  - 101
DA  - 2010/01
ER  - 

@inproceedings{V275945479,
   = {Chen, Wenbin and McCarthy, KG and Copuroglu, M and O'Brien, S and Winfield, R and Mathewson, A},
   = {Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on},
   = {{Electrical characterization of novel PMNT thin-films}},
   = {2010},
   = {January},
   = {Validated},
   = {()},
  pages = {98--101},
  source = {IRIS}
}