Modelling and characterisation of high-k dielectric Thin-films using microwave techniques

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TY  - JOUR
  - Chen, W and McCarthy, KG and \cCopuro\uglu, M and O'Brien, S and Winfield, R and Mathewson, A
  - 2010
  - January
  - IOP Conference Series: Materials Science and Engineering
  - Modelling and characterisation of high-k dielectric Thin-films using microwave techniques
  - Validated
  - 8
  - 1
  - 012020
DA  - 2010/01
ER  - 
@article{V275945516,
   = {Chen, W and McCarthy, KG and \cCopuro\uglu, M and O'Brien, S and Winfield, R and Mathewson, A},
   = {2010},
   = {January},
   = {IOP Conference Series: Materials Science and Engineering},
   = {Modelling and characterisation of high-k dielectric Thin-films using microwave techniques},
   = {Validated},
   = {8},
   = {1},
  pages = {012020},
  source = {IRIS}
}
AUTHORSChen, W and McCarthy, KG and \cCopuro\uglu, M and O'Brien, S and Winfield, R and Mathewson, A
YEAR2010
MONTHJanuary
JOURNALIOP Conference Series: Materials Science and Engineering
TITLEModelling and characterisation of high-k dielectric Thin-films using microwave techniques
STATUSValidated
PEER_REVIEW
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VOLUME8
ISSUE1
START_PAGE012020
END_PAGE
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