TY  - JOUR
  - Minehane, S and Duane, R and O'Sullivan, P and McCarthy, KG and Mathewson, A
  - 2000
  - January
  - Microelectronics Reliability
  - Design for reliability
  - Validated
  - 40
  - 8
  - 1285
  - 1294
DA  - 2000/01
ER  - 

@article{V276842039,
   = {Minehane, S and Duane, R and O'Sullivan, P and McCarthy, KG and Mathewson, A},
   = {2000},
   = {January},
   = {Microelectronics Reliability},
   = {Design for reliability},
   = {Validated},
   = {40},
   = {8},
  pages = {1285--1294},
  source = {IRIS}
}