TY  - CONF
  - MacSweeney, D and McCarthy, KG and Floyd, L and Mathewson, A and Hurley, P and Power, JA and Kelly, SC
  - Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on
  - Influence of probing configuration and data set size for bipolar junction capacitance determination
  - 2002
  - January
  - Validated
  - ()
  - 127
  - 132
DA  - 2002/01
ER  - 

@inproceedings{V276842197,
   = {MacSweeney, D and McCarthy, KG and Floyd, L and Mathewson, A and Hurley, P and Power, JA and Kelly, SC},
   = {Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on},
   = {{Influence of probing configuration and data set size for bipolar junction capacitance determination}},
   = {2002},
   = {January},
   = {Validated},
   = {()},
  pages = {127--132},
  source = {IRIS}
}