TY  - CONF
  - Minehane, S and McCarthy, KG and O'Sullivan, P and Mathewson, A
  - Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  - Statistical Hot-Carrier Reliability Simulation using a Novel SPICE Parameter Evolution Model
  - 2000
  - January
  - Validated
  - ()
  - 616
  - 619
DA  - 2000/01
ER  - 

@inproceedings{V276842257,
   = {Minehane, S and McCarthy, KG and O'Sullivan, P and Mathewson, A},
   = {Solid-State Device Research Conference, 2000. Proceeding of the 30th European},
   = {{Statistical Hot-Carrier Reliability Simulation using a Novel SPICE Parameter Evolution Model}},
   = {2000},
   = {January},
   = {Validated},
   = {()},
  pages = {616--619},
  source = {IRIS}
}