Efficient Parameter Extraction and Statistical Analysis for a 0.25 um low-power CMOS Process

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TY  - CONF
  - Saavedra Diaz, EV and McCarthy, KG and Klaassen, DBM and Mathewson, A
  - Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  - Efficient Parameter Extraction and Statistical Analysis for a 0.25 um low-power CMOS Process
  - 1997
  - January
  - Validated
  - ()
  - 656
  - 659
DA  - 1997/01
ER  - 
@inproceedings{V276842307,
   = {Saavedra Diaz, EV and McCarthy, KG and Klaassen, DBM and Mathewson, A},
   = {Solid-State Device Research Conference, 1997. Proceeding of the 27th European},
   = {{Efficient Parameter Extraction and Statistical Analysis for a 0.25 um low-power CMOS Process}},
   = {1997},
   = {January},
   = {Validated},
   = {()},
  pages = {656--659},
  source = {IRIS}
}
AUTHORSSaavedra Diaz, EV and McCarthy, KG and Klaassen, DBM and Mathewson, A
TITLESolid-State Device Research Conference, 1997. Proceeding of the 27th European
PUBLICATION_NAMEEfficient Parameter Extraction and Statistical Analysis for a 0.25 um low-power CMOS Process
YEAR1997
MONTHJanuary
STATUSValidated
PEER_REVIEW
TIMES_CITED()
SEARCH_KEYWORD
EDITORS
START_PAGE656
END_PAGE659
LOCATION
START_DATE
END_DATE
ABSTRACT
FUNDED_BY
URL
DOI_LINK
FUNDING_BODY
GRANT_DETAILS