TY  - JOUR
  - O'Shea, M and Duane, R and McCarthy, D and McCarthy, KG and Concannon, A and Mathewson, A
  - 2003
  - January
  - IEEE Transactions on Semiconductor Manufacturing
  - SPECIAL SECTION ON THE INTERNATIONAL CONFERENCE ON MICROELECTRONICS TEST STRUCTURES-SPECIAL SECTION PAPERS-Compact Model Development for a New Nonvolatile Memory Cell Architecture
  - Validated
  - 16
  - 2
  - 215
  - 219
DA  - 2003/01
ER  - 

@article{V276842348,
   = {O'Shea, M and Duane, R and McCarthy, D and McCarthy, KG and Concannon, A and Mathewson, A},
   = {2003},
   = {January},
   = {IEEE Transactions on Semiconductor Manufacturing},
   = {SPECIAL SECTION ON THE INTERNATIONAL CONFERENCE ON MICROELECTRONICS TEST STRUCTURES-SPECIAL SECTION PAPERS-Compact Model Development for a New Nonvolatile Memory Cell Architecture},
   = {Validated},
   = {16},
   = {2},
  pages = {215--219},
  source = {IRIS}
}