IRIS publication 342886
Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes [B2747]
RIS format for Endnote and similar
TY - JOUR - Healy, S.; McCarthy, K.; Mason, B.; Mathewson, A. - 0 - Iee Colloquium (Digest) - Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes [B2747] - Published - () - 0.033 - 13 - 01/13/07 DA - 0/NaN ER -
BIBTeX format for JabRef and similar
@article{V342886, = {Healy, S. and McCarthy, K. and Mason, B. and Mathewson, A.}, = {0}, = {Iee Colloquium (Digest)}, = {Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes [B2747]}, = {Published}, = {()}, = {0.033}, pages = {13--01/13/07}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | Healy, S.; McCarthy, K.; Mason, B.; Mathewson, A. | ||
YEAR | 0 | ||
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JOURNAL_CODE | Iee Colloquium (Digest) | ||
TITLE | Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes [B2747] | ||
STATUS | Published | ||
TIMES_CITED | () | ||
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VOLUME | 0.033 | ||
ISSUE | |||
START_PAGE | 13 | ||
END_PAGE | 01/13/07 | ||
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