TY  - JOUR
  - Minehane,S.; Duane,R.; O'Sullivan,P.; McCarthy,K.G.; Mathewson,A.
  - 2000
  - August
  - Microelectronics and Reliability
  - Design for Reliability
  - Published
  - ()
  - 40
  - 8-10
  - 1285
  - 1294
DA  - 2000/08
ER  - 

@article{V343465,
   = {Minehane,S. and  Duane,R. and  O'Sullivan,P. and  McCarthy,K.G. and  Mathewson,A.},
   = {2000},
   = {August},
   = {Microelectronics and Reliability},
   = {Design for Reliability},
   = {Published},
   = {()},
   = {40},
   = {8-10},
  pages = {1285--1294},
  source = {IRIS}
}