RIS format for Endnote and similar
TY - CONF - Foley, S.; Ryan, A.; Martin, D.; Mathewson, A. - Proceedings of the International Symposium on the Physical ;Failure Analysis of Integrated Circuits, IPFA - Study of the Influence of Inter-Metal Dielectrics on Electromigration Performance [B2741] - N/A - 2003 - () - 01-JAN-03 - 30-DEC-99 DA - 2003/NaN ER -
BIBTeX format for JabRef and similar
@unpublished{V374480, = {Foley, S. and Ryan, A. and Martin, D. and Mathewson, A.}, = {Proceedings of the International Symposium on the Physical ;Failure Analysis of Integrated Circuits, IPFA}, = {Study of the Influence of Inter-Metal Dielectrics on Electromigration Performance [B2741]}, = {N/A}, = {2003}, = {()}, month = {Jan}, = {30-DEC-99}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | Foley, S.; Ryan, A.; Martin, D.; Mathewson, A. | ||
TITLE | Proceedings of the International Symposium on the Physical ;Failure Analysis of Integrated Circuits, IPFA | ||
PUBLICATION_NAME | * | ||
LOCATION | Study of the Influence of Inter-Metal Dielectrics on Electromigration Performance [B2741] | ||
CONFERENCE_TYPE | N/A | ||
YEAR | 2003 | ||
TIMES_CITED | () | ||
PEER_REVIEW | |||
START_DATE | 01-JAN-03 | ||
END_DATE | 30-DEC-99 | ||
ABSTRACT | |||
FUNDED_BY | * |