IRIS publication 376024
Efficient Parameter Extraction Techniques for a New Surface-Potential-Based MOS Model for RF Applications
RIS format for Endnote and similar
TY - CONF - Liang,W.; van Langevelde,R,; McCarthy,K.G.; Klaassen, D.B.M. - International Conference on Microelectronic Test Structures (ICMTS 2001) - Efficient Parameter Extraction Techniques for a New Surface-Potential-Based MOS Model for RF Applications - 2001 - March - Published - 1 - () - Hazama,H.; Ohzone,T. - 141 - 145 - Kobe, Japan - 19-MAR-01 - 22-MAR-01 - Private/Academic Travel Grant DA - 2001/03 ER -
BIBTeX format for JabRef and similar
@inproceedings{V376024, = {Liang,W. and van Langevelde,R, and McCarthy,K.G. and Klaassen, D.B.M.}, = {International Conference on Microelectronic Test Structures (ICMTS 2001)}, = {{Efficient Parameter Extraction Techniques for a New Surface-Potential-Based MOS Model for RF Applications}}, = {2001}, = {March}, = {Published}, = {1}, = {()}, = {Hazama,H. and Ohzone,T.}, pages = {141--145}, = {Kobe, Japan}, month = {Mar}, = {22-MAR-01}, = {Private/Academic Travel Grant}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | Liang,W.; van Langevelde,R,; McCarthy,K.G.; Klaassen, D.B.M. | ||
TITLE | International Conference on Microelectronic Test Structures (ICMTS 2001) | ||
PUBLICATION_NAME | Efficient Parameter Extraction Techniques for a New Surface-Potential-Based MOS Model for RF Applications | ||
YEAR | 2001 | ||
MONTH | March | ||
STATUS | Published | ||
PEER_REVIEW | 1 | ||
TIMES_CITED | () | ||
SEARCH_KEYWORD | |||
EDITORS | Hazama,H.; Ohzone,T. | ||
START_PAGE | 141 | ||
END_PAGE | 145 | ||
LOCATION | Kobe, Japan | ||
START_DATE | 19-MAR-01 | ||
END_DATE | 22-MAR-01 | ||
ABSTRACT | |||
FUNDED_BY | Private/Academic Travel Grant | ||
URL | |||
DOI_LINK | |||
FUNDING_BODY | |||
GRANT_DETAILS |