TY  - CONF
  - Healy,S.; Horan,E.; McCarthy,K.G; Mathewson,A.; Ning,Z.; Rombouts,E.; Vanderbauwhede,W.; Tack,M.
  - International Conference on Microelectronic Test Structures (ICMTS 1999)
  - Implementation of Statistical Characterization and Design Techniques for an Industrial 0.5um CMOS Technology
  - 1999
  - March
  - Published
  - 1
  - ()
  - Mathewson,A.; Jeppson,K.O.
  - 227
  - 232
  - Goteborg, Sweden
  - 15-MAR-99
  - 18-MAR-99
  - N/A
DA  - 1999/03
ER  - 

@inproceedings{V376078,
   = {Healy,S. and  Horan,E. and  McCarthy,K.G and  Mathewson,A. and  Ning,Z. and  Rombouts,E. and  Vanderbauwhede,W. and  Tack,M.},
   = {International Conference on Microelectronic Test Structures (ICMTS 1999)},
   = {{Implementation of Statistical Characterization and Design Techniques for an Industrial 0.5um CMOS Technology}},
   = {1999},
   = {March},
   = {Published},
   = {1},
   = {()},
   = {Mathewson,A. and  Jeppson,K.O.},
  pages = {227--232},
   = {Goteborg, Sweden},
  month = {Mar},
   = {18-MAR-99},
   = {N/A},
  source = {IRIS}
}