TY  - CONF
  - MacSweeney,D.; McCarthy,K.G.; Mathewson,A.; Power, J.A.; Kelly,S.C.
  - International Conference on Microelecronic Test Structures (ICMTS 1999)
  - Inclusion of Substrate Effects in the Flyback Method for BJT Resistance Characterisation
  - 1999
  - March
  - Published
  - 1
  - ()
  - Mathewson,A.; Jeppson,K.O.
  - 194
  - 199
  - Goteborg, Sweden
  - 15-MAR-99
  - 18-MAR-99
  - N/A
DA  - 1999/03
ER  - 

@inproceedings{V376117,
   = {MacSweeney,D. and  McCarthy,K.G. and  Mathewson,A. and  Power, J.A. and  Kelly,S.C.},
   = {International Conference on Microelecronic Test Structures (ICMTS 1999)},
   = {{Inclusion of Substrate Effects in the Flyback Method for BJT Resistance Characterisation}},
   = {1999},
   = {March},
   = {Published},
   = {1},
   = {()},
   = {Mathewson,A. and  Jeppson,K.O.},
  pages = {194--199},
   = {Goteborg, Sweden},
  month = {Mar},
   = {18-MAR-99},
   = {N/A},
  source = {IRIS}
}