TY  - CONF
  - Minehane,S.; Healy,S.; O'Sullivan,P.; McCarthy,K.; Mathewson,A.; Mason,B.
  - 6th International Symposium on the Physics and Failure Analysis of Integrated Circuits (IPFA 1997)
  - Direct BSIM3v3 Parameter Extraction for Hot Carrier Reliability Simulation of n-Channel LDD MOSFETs
  - 1997
  - July
  - Published
  - 1
  - ()
  - 133
  - 139
  - Singapore
  - 21-JUL-97
  - 25-JUL-97
  - N/A
DA  - 1997/07
ER  - 

@inproceedings{V376264,
   = {Minehane,S. and  Healy,S. and  O'Sullivan,P. and  McCarthy,K. and  Mathewson,A. and  Mason,B.},
   = {6th International Symposium on the Physics and Failure Analysis of Integrated Circuits (IPFA 1997)},
   = {{Direct BSIM3v3 Parameter Extraction for Hot Carrier Reliability Simulation of n-Channel LDD MOSFETs}},
   = {1997},
   = {July},
   = {Published},
   = {1},
   = {()},
  pages = {133--139},
   = {Singapore},
  month = {Jul},
   = {25-JUL-97},
   = {N/A},
  source = {IRIS}
}