TY  - CONF
  - Healy,S.; McCarthy,K.; Mason,B.; Mathewson,A.
  - IEE Colloquium on Advanced MOS and Bi-Polar Devices
  - Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes
  - London, U.K.
  - Oral Presentation
  - 1995
  - ()
  - 14-FEB-95
  - 14-FEB-95
  - N/A
DA  - 1995/NaN
ER  - 

@unpublished{V376303,
   = {Healy,S. and  McCarthy,K. and  Mason,B. and  Mathewson,A.},
   = {IEE Colloquium on Advanced MOS and Bi-Polar Devices},
   = {{Temperature Characterisation and Parameter Extraction for Fine-Geometry CMOS Processes}},
   = {London, U.K.},
   = {Oral Presentation},
   = {1995},
   = {()},
  month = {Feb},
   = {14-FEB-95},
   = {N/A},
  source = {IRIS}
}