IRIS publication 376307
MOS Model Parameter Extraction Techniques: A Comparison
RIS format for Endnote and similar
TY - CONF - Cahill,C.G.; McCarthy,K.; Lane,W.A. - 2nd International Conference on the Simulation of Semiconductor Devices and Processes (Vol. 2) - MOS Model Parameter Extraction Techniques: A Comparison - 1986 - July - Published - 1 - () - Board,K.; Owen,D.R.J. - Swansea, U.K. - 21-JUL-86 - 23-JUL-86 DA - 1986/07 ER -
BIBTeX format for JabRef and similar
@inproceedings{V376307, = {Cahill,C.G. and McCarthy,K. and Lane,W.A.}, = {2nd International Conference on the Simulation of Semiconductor Devices and Processes (Vol. 2)}, = {{MOS Model Parameter Extraction Techniques: A Comparison}}, = {1986}, = {July}, = {Published}, = {1}, = {()}, = {Board,K. and Owen,D.R.J.}, = {Swansea, U.K.}, month = {Jul}, = {23-JUL-86}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | Cahill,C.G.; McCarthy,K.; Lane,W.A. | ||
TITLE | 2nd International Conference on the Simulation of Semiconductor Devices and Processes (Vol. 2) | ||
PUBLICATION_NAME | MOS Model Parameter Extraction Techniques: A Comparison | ||
YEAR | 1986 | ||
MONTH | July | ||
STATUS | Published | ||
PEER_REVIEW | 1 | ||
TIMES_CITED | () | ||
SEARCH_KEYWORD | |||
EDITORS | Board,K.; Owen,D.R.J. | ||
START_PAGE | * | ||
END_PAGE | * | ||
LOCATION | Swansea, U.K. | ||
START_DATE | 21-JUL-86 | ||
END_DATE | 23-JUL-86 | ||
ABSTRACT | |||
FUNDED_BY | * | ||
URL | |||
DOI_LINK | |||
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