IRIS publication 379651
Verification of Layout Efficient Shield-Based De-Embedding Techniques for On-Wafer HBT Characterization up to 30GHz
RIS format for Endnote and similar
TY - CONF - O'Sullivan,J.A.;McCarthy,K.G.;Murphy,A.C.;Murphy,P.J. - IEEE International Conference on Microelectronic Test Structures (ICMTS) - Verification of Layout Efficient Shield-Based De-Embedding Techniques for On-Wafer HBT Characterization up to 30GHz - 2005 - April - Published - 1 - () - Schaper,U.;Sansen,W. - 119 - 124 - Leuven, Belgium - 04-APR-05 - 07-APR-05 - Enterprise Ireland DA - 2005/04 ER -
BIBTeX format for JabRef and similar
@inproceedings{V379651, = {O'Sullivan,J.A. and McCarthy,K.G. and Murphy,A.C. and Murphy,P.J.}, = {IEEE International Conference on Microelectronic Test Structures (ICMTS)}, = {{Verification of Layout Efficient Shield-Based De-Embedding Techniques for On-Wafer HBT Characterization up to 30GHz}}, = {2005}, = {April}, = {Published}, = {1}, = {()}, = {Schaper,U. and Sansen,W.}, pages = {119--124}, = {Leuven, Belgium}, month = {Apr}, = {07-APR-05}, = {Enterprise Ireland}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | O'Sullivan,J.A.;McCarthy,K.G.;Murphy,A.C.;Murphy,P.J. | ||
TITLE | IEEE International Conference on Microelectronic Test Structures (ICMTS) | ||
PUBLICATION_NAME | Verification of Layout Efficient Shield-Based De-Embedding Techniques for On-Wafer HBT Characterization up to 30GHz | ||
YEAR | 2005 | ||
MONTH | April | ||
STATUS | Published | ||
PEER_REVIEW | 1 | ||
TIMES_CITED | () | ||
SEARCH_KEYWORD | |||
EDITORS | Schaper,U.;Sansen,W. | ||
START_PAGE | 119 | ||
END_PAGE | 124 | ||
LOCATION | Leuven, Belgium | ||
START_DATE | 04-APR-05 | ||
END_DATE | 07-APR-05 | ||
ABSTRACT | |||
FUNDED_BY | Enterprise Ireland | ||
URL | |||
DOI_LINK | |||
FUNDING_BODY | |||
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