IRIS publication 379653
Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard
RIS format for Endnote and similar
TY - CONF - O'Sullivan,J.A.;McCarthy,K.G.;Murphy,P.J. - IEEE International Conference on Microelectronic Test Structures (ICMTS) - Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard - 2006 - March - Published - 1 - () - Austin, USA - 06-MAR-06 - 09-MAR-06 - Enterprise Ireland DA - 2006/03 ER -
BIBTeX format for JabRef and similar
@inproceedings{V379653, = {O'Sullivan,J.A. and McCarthy,K.G. and Murphy,P.J.}, = {IEEE International Conference on Microelectronic Test Structures (ICMTS)}, = {{Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard}}, = {2006}, = {March}, = {Published}, = {1}, = {()}, = {Austin, USA}, month = {Mar}, = {09-MAR-06}, = {Enterprise Ireland}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | O'Sullivan,J.A.;McCarthy,K.G.;Murphy,P.J. | ||
TITLE | IEEE International Conference on Microelectronic Test Structures (ICMTS) | ||
PUBLICATION_NAME | Characterisation of Advanced Multilayer De-embedding Structures up to 50GHz Incorporating a Novel Validation Standard | ||
YEAR | 2006 | ||
MONTH | March | ||
STATUS | Published | ||
PEER_REVIEW | 1 | ||
TIMES_CITED | () | ||
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EDITORS | * | ||
START_PAGE | * | ||
END_PAGE | * | ||
LOCATION | Austin, USA | ||
START_DATE | 06-MAR-06 | ||
END_DATE | 09-MAR-06 | ||
ABSTRACT | |||
FUNDED_BY | Enterprise Ireland | ||
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