Modeling and Characterization of high-k dielectric thin-films using microwave techniques

Typeset version

 

TY  - JOUR
  - Chen, W; McCarthy, KG; Copuroglu, M; O'Brien, S; Winfield, R; Mathewson, A
  - 2010
  - March
  - IOP Conference Series: Materials Science and Engineering
  - Modeling and Characterization of high-k dielectric thin-films using microwave techniques
  - Published
  - ()
  - 8
  - 1
  - 4
DA  - 2010/03
ER  - 
@article{V68097227,
   = {Chen, W and  McCarthy, KG and  Copuroglu, M and  O'Brien, S and  Winfield, R and  Mathewson, A},
   = {2010},
   = {March},
   = {IOP Conference Series: Materials Science and Engineering},
   = {Modeling and Characterization of high-k dielectric thin-films using microwave techniques},
   = {Published},
   = {()},
   = {8},
  pages = {1--4},
  source = {IRIS}
}
AUTHORSChen, W; McCarthy, KG; Copuroglu, M; O'Brien, S; Winfield, R; Mathewson, A
YEAR2010
MONTHMarch
JOURNAL_CODEIOP Conference Series: Materials Science and Engineering
TITLEModeling and Characterization of high-k dielectric thin-films using microwave techniques
STATUSPublished
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VOLUME8
ISSUE
START_PAGE1
END_PAGE4
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