TY  - CONF
  - Chen, W; McCarthy, KG; Copuroglu, M; O'Brien, S; Winfield, R; Mathewson, A
  - IEEE International Conference on Microelectronic Test Structures
  - Electrical Characterization of Novel PMNT Thin-films
  - 2010
  - March
  - Validated
  - 1
  - ()
  - 98
  - 101
  - Hiroshima
  - 22-MAR-10
  - 25-MAR-10
DA  - 2010/03
ER  - 

@inproceedings{V68097260,
   = {Chen, W and  McCarthy, KG and  Copuroglu, M and  O'Brien, S and  Winfield, R and  Mathewson, A},
   = {IEEE International Conference on Microelectronic Test Structures},
   = {{Electrical Characterization of Novel PMNT Thin-films}},
   = {2010},
   = {March},
   = {Validated},
   = {1},
   = {()},
  pages = {98--101},
   = {Hiroshima},
  month = {Mar},
   = {25-MAR-10},
  source = {IRIS}
}