IRIS publication 68097302
Dielectric Characterization for Novel High-k Thin-films using Microwave Techniques
RIS format for Endnote and similar
TY - CONF - Chen, W., O'Sullivan, J.A., McCarthy, K.G. - IET China-Ireland International Conference on Information and Communications Technologies (CIICT) - Dielectric Characterization for Novel High-k Thin-films using Microwave Techniques - 2008 - September - Validated - 1 - () - 631 - 634 - Beijing - 26-SEP-08 - 30-SEP-08 DA - 2008/09 ER -
BIBTeX format for JabRef and similar
@inproceedings{V68097302, = {Chen, W. and O'Sullivan, J.A. and McCarthy, K.G. }, = {IET China-Ireland International Conference on Information and Communications Technologies (CIICT)}, = {{Dielectric Characterization for Novel High-k Thin-films using Microwave Techniques}}, = {2008}, = {September}, = {Validated}, = {1}, = {()}, pages = {631--634}, = {Beijing}, month = {Sep}, = {30-SEP-08}, source = {IRIS} }
Data as stored in IRIS
AUTHORS | Chen, W., O'Sullivan, J.A., McCarthy, K.G. | ||
TITLE | IET China-Ireland International Conference on Information and Communications Technologies (CIICT) | ||
PUBLICATION_NAME | Dielectric Characterization for Novel High-k Thin-films using Microwave Techniques | ||
YEAR | 2008 | ||
MONTH | September | ||
STATUS | Validated | ||
PEER_REVIEW | 1 | ||
TIMES_CITED | () | ||
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START_PAGE | 631 | ||
END_PAGE | 634 | ||
LOCATION | Beijing | ||
START_DATE | 26-SEP-08 | ||
END_DATE | 30-SEP-08 | ||
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