IRIS publication 728421
Characterisation of Advanced Multilayer De-Embedding Structures Up to 50 Ghz Incorporating A Novel Validation Standard
RIS format for Endnote and similar
TY - - Other - O'Sullivan, JA, McCarthy, KG, Murphy, PJ - 2006 - June - Characterisation of Advanced Multilayer De-Embedding Structures Up to 50 Ghz Incorporating A Novel Validation Standard - Validated - 1 - () - Modern multi-level metallisation schemes offer the possibility of many innovative structures for frequency characterisation and de-embedding. In this paper we perform a detailed charaterisation of several such structures up to 50 GHz and show their application to measurements of a high performance HBT device. We further propose a consistency check, by comparing independent DC and s-parameter measurements, to gain further confidence in the de-embedding operations.. - 59 - 64 DA - 2006/06 ER -
BIBTeX format for JabRef and similar
@misc{V728421, = {Other}, = {O'Sullivan, JA and McCarthy, KG and Murphy, PJ }, = {2006}, = {June}, = {Characterisation of Advanced Multilayer De-Embedding Structures Up to 50 Ghz Incorporating A Novel Validation Standard}, = {Validated}, = {1}, = {()}, = {{Modern multi-level metallisation schemes offer the possibility of many innovative structures for frequency characterisation and de-embedding. In this paper we perform a detailed charaterisation of several such structures up to 50 GHz and show their application to measurements of a high performance HBT device. We further propose a consistency check, by comparing independent DC and s-parameter measurements, to gain further confidence in the de-embedding operations..}}, pages = {59--64}, source = {IRIS} }
Data as stored in IRIS
OTHER_PUB_TYPE | Other | ||
AUTHORS | O'Sullivan, JA, McCarthy, KG, Murphy, PJ | ||
YEAR | 2006 | ||
MONTH | June | ||
TITLE | Characterisation of Advanced Multilayer De-Embedding Structures Up to 50 Ghz Incorporating A Novel Validation Standard | ||
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STATUS | Validated | ||
PEER_REVIEW | 1 | ||
TIMES_CITED | () | ||
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ABSTRACT | Modern multi-level metallisation schemes offer the possibility of many innovative structures for frequency characterisation and de-embedding. In this paper we perform a detailed charaterisation of several such structures up to 50 GHz and show their application to measurements of a high performance HBT device. We further propose a consistency check, by comparing independent DC and s-parameter measurements, to gain further confidence in the de-embedding operations.. | ||
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START_PAGE | 59 | ||
END_PAGE | 64 | ||
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