Associated dataset for 'Barrier–channel intermixing and 2-dimensional electron gas degradation in Al-rich Al(Ga)N/AlGaN high electron mobility transistor heterostructures'

Date made available	May 2026
Publisher	Zenodo

Contact person

• Badal Mondal

• DOI

  10.5281/zenodo.20042244

Access Dataset

• https://zenodo.org/doi/10.5281/zenodo.20042244

Research output

Research output per year 2026 2026 2026

• 1 Software
• 1 Preprint

Research output per year

Research output per year

• Barrier-channel intermixing and 2-dimensional electron gas degradation in Al-rich Al(Ga)N/AlGaN high electron mobility transistor heterostructures

  Pampili, P., Zubialevich, V. Z., Mondal, B., Mukherjee, J., Schulz, S., Moran, D. A. J. & Parbrook, P. J., 2026, arXiv.

  Research output: Working paper/Preprint › Preprint

• XRDmapAnalysis/xrdpy: xrdpy-v0.0.5

  Mondal, B. & Pampili, P., 5 Feb 2026

  Research output: Non-textual form › Software

Cite this

• DataSetCite

Mondal, B. (Creator), Zubialevich, V. (Contributor), Pampili, P. (Owner), Mukherjee, J. (Contributor), Schulz, S. (Supervisor), Parbrook, P. J. (Supervisor) (May 2026). Associated dataset for 'Barrier–channel intermixing and 2-dimensional electron gas degradation in Al-rich Al(Ga)N/AlGaN high electron mobility transistor heterostructures'. Zenodo. 10.5281/zenodo.20042244