Research output per year
Research output per year
Personal profile
Biography
With a background in Physics and Instrumentation, my current focus at Tyndall National Institute (UCC) is on advancing semiconductor device and material testing using electron beam and atomic force microscopy. At Tyndall, we collaborate with both industry and academia, supporting research at every level—from student projects to nationally funded programs. As an NI Certified LabVIEW Developer, I train staff and students in test and measurement automation, ensuring customer needs are met by developing tailored measurement protocols and providing customised software handovers.
Past R&D focused on developing optical astronomy instruments, including the Galway Ultra-Fast Imager (GUFI Mk I) using an Andor low-light CCD. Responsibilities included CAD design, hardware fabrication, prototype testing, and creating a Python-based image processing pipeline. This work supported observations at major European observatories such as WHT and Calar-Alto
Research Interests
AFM, SEM, TEM, LabVIEW, Electrical Test, Optical Detectors
External positions
Postdoctoral Researcher , University of Galway
1 Mar 2009 → 30 Mar 2011
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Combined Swelling and Metal Infiltration: Advancing Block Copolymer Pattern Control for Nanopatterning Applications
Mullen, E., Alvarez-Fernandez, A., Prochukhan, N., Davó-Quiñonero, A., Bekarevich, R., Gity, F., Sheehan, B., Baez Vasquez, J. F., Gatensby, R., Bentaleb, A., Ward, A., Hurley, P. K. & Morris, M. A., 31 Jan 2025, In: ACS Applied Nano Materials. 8, 4, p. 1829-1842 14 p.Research output: Contribution to journal › Article › peer-review
Open Access -
Dopingless Ambipolar Field-Effect Transistors Based on MoTe2 2D Material for CMOS Nanoelectronics
Patil, V., Neill, H., Sheehan, B., Hurley, P. K., Ansari, L. & Gity, F., 2025, (Accepted/In press) In: Advanced Electronic Materials.Research output: Contribution to journal › Article › peer-review
Open Access -
Rapid, versatile, and reliable metrology for multi-layer transition metal dichalcogenide thin films using atomic force microscopy to investigate surface grain distributions
Tonon, A., Gupta, A., Di Russo, E., Sheehan, B., Metaxa, P., Arifutzzaman, A., Connolly, J., Lin, J., Povey, I., Sgarbossa, F., De Salvador, D., Napolitani, E. & Duffy, R., 22 Sep 2025, In: Applied Physics Letters. 127, 12, 123102.Research output: Contribution to journal › Article › peer-review
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Field-induced reversible insulator-to-metal transition and the onset of ferroelectricity in molybdenum trioxide films
Dragoman, M., Modreanu, M., Sheehan, B., Vulpe, S., Romanitan, C., Aldrigo, M., Dinescu, A., Serban, A. B. & Dragoman, D., 7 Jun 2023, In: Journal of Applied Physics. 133, 21, 215101.Research output: Contribution to journal › Article › peer-review
Open Access -
Laser induced crystallization of sputtered MoS2 thin films
Tonon, A., Di Russo, E., Sgarbossa, F., Bacci, L., Argiolas, N., Scian, C., Ivanov, Y. P., Divitini, G., Sheehan, B., De Salvador, D., Gasparotto, A., Morandi, V., Duffy, R. & Napolitani, E., Sep 2023, In: Materials Science in Semiconductor Processing. 164, 107616.Research output: Contribution to journal › Article › peer-review
Open Access