Research output per year
Research output per year
Fingerprint
Dive into the research topics where Eoin Sheehan is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
-
Sources of variation in piezoresistive stress sensor measurements
Slattery, O., O'Mahoney, D., Sheehan, E. & Waldron, F., Mar 2004, In: IEEE Transactions on Components and Packaging Technologies. 27, 1, p. 81-86 6 p.Research output: Contribution to journal › Article › peer-review
-
Predicting thermomechanical stress using mesmeric methodology
Slattery, O., O'Mahoney, D., Sheehan, E., Waldron, F. & McCarthy, G., 2002, p. 884-891. 8 p.Research output: Contribution to conference › Paper › peer-review
-
Predicting thermomechanical stress using MESMERIC methodology
Slattery, O., O'Mahoney, D., Sheehan, E., Waldron, F. & McCarthy, G., 2002, ITHERM 2002 - 8th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems. Sammakia, B. G., Joshi, Y. K., Subbarayan, G., Amon, C. H., Ramakrishna, K. & Sathe, S. B. (eds.). IEEE Computer Society, p. 884-891 8 p. 1012548. (InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITHERM; vol. 2002-January).Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review
-
Plasma process induced degradation of thin inter-polysilicon dielectric layers
Hurley, P. K., Rodrigues, R., Kay, P., Thakur, R. P. S., Clarke, D., Sheehan, E. & Mathewson, A., 1999, p. 45-48. 4 p.Research output: Contribution to conference › Paper › peer-review
-
Hot carrier degradation mechanisms in sub-micron p channel MOSFETs: Impact on low frequency (1/f) noise behaviour
Sheehan, E., Hurley, P. K. & Mathewson, A., 1998, In: Microelectronics Reliability. 38, 6-8, p. 931-936 6 p.Research output: Contribution to journal › Article › peer-review
Press/Media
-
Full Sigerson Cup squads: Are your club mates and county stars playing in college football's biggest competition?
Kelly, S., Boyle, E. J., Sheehan, E., Coakley, D., Doyle, T. & Murphy, M.
6/01/25
1 item of Media coverage
Press/Media