Research output per year
Research output per year
Personal profile
PhD Supervision
- Available for PhD supervision
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Dive into the research topics where Karim Cherkaoui is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Methodology and Test Structures for Studying β-Ga2O3 Dielectric and Contact Interfaces
Gruszecki, A. A., Roy, J., Agrawal, K. S., La Torraca, P., Cherkaoui, K., Hurley, P. K., Wallace, R. M. & Young, C. D., 2025, 2025 IEEE 37th International Conference on Microelectronic Test Structures (ICMTS).Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review
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The characterization and understanding of electrically active defects in the HfO2/β-Ga2O3(2̄01) MOS system
Agrawal, K. S., La Torraca, P., Valentijn, J., Hawkins, R., Gruszecki, A. A., Roy, J., Lebedev, V., Jones, L., Wallace, R. M., Young, C. D., Hurley, P. K. & Cherkaoui, K., 1 Aug 2025, In: APL Materials. 13, 8, 081116.Research output: Contribution to journal › Article › peer-review
Open Access -
Sidewall passivation of AlxGa1−xAs homojunctions with wet chemicals and field-effect passivation by ALD oxides and nitrides
Lemaire, A., Blake, A., Amargianitakis, E. A., Justice, J., Garnier, J., Cherkaoui, K. & Corbett, B., Sep 2024, In: Surfaces and Interfaces. 52, 104876.Research output: Contribution to journal › Article › peer-review
Open Access -
Electrically active defects in Al2O3-InGaAs MOS stacks at cryogenic temperatures
La Torraca, P., Padovani, A., Wernersson, L. E., Cherkaoui, K., Hurley, P. & Larcher, L., 2023, 2023 IEEE International Integrated Reliability Workshop, IIRW 2023. Institute of Electrical and Electronics Engineers Inc., (IEEE International Integrated Reliability Workshop Final Report).Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review
Open Access -
High-k/InGaAs interface defects at cryogenic temperature
Cherkaoui, K., La Torraca, P., Lin, J., Maraviglia, N., Andersen, A., Wernersson, L. E., Padovani, A., Larcher, L. & Hurley, P. K., Sep 2023, In: Solid-State Electronics. 207, 108719.Research output: Contribution to journal › Article › peer-review
Open Access