@inbook{5c93bf8fe17f41d4922b1a2adb938d7f,
title = "3D numerical simulation for assisting external latch-up protection test structure design",
abstract = "We report on the development of a method for characterising ESD protection test structures designed to determine the efficiency of surrounding guard-rings preventing external latch-up. The new technique uses a simulation approach to reduce the number of iterations of test structures that are fabricated, therefore dramatically reducing the time required to generate design guidelines. The outline of this technique concentrates on the importance of results from 3D numerical device simulations to the simulation methodology. The presented results demonstrate the sensitivity of the technique to the direction of the leakage current entering the latch-up path and its impact on the overall characterisation results for the test structure.",
author = "K. Palser and A. Concannon and R. Duffy and A. Mathewson",
year = "1999",
language = "English",
series = "European Solid-State Device Research Conference",
publisher = "IEEE Computer Society",
pages = "508--511",
editor = "R.P. Mertens and H. Grunbacher and H.E. Maes and G. Declerck",
booktitle = "ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference",
address = "United States",
note = "29th European Solid-State Device Research Conference, ESSDERC 1999 ; Conference date: 13-09-1999 Through 15-09-1999",
}