A combined capacitance-voltage and hard x-ray photoelectron spectroscopy characterisation of metal/Al2O3/In0.53Ga 0.47As capacitor structures
- Jun Lin
- , Lee Walsh
- , Greg Hughes
- , Joseph C. Woicik
- , Ian M. Povey
- , Terrance P. O'Regan
- , Paul K. Hurley
- Dublin City University
- National Institute of Standards and Technology
- U.S. Army Research Laboratory
Research output: Contribution to journal › Article › peer-review