A Digitally Calibrated 1stOrder Noise Shaped SAR ADC in 28 nm CMOS

Research output: Chapter in Book/Report/Conference proceedingsChapterpeer-review

Abstract

This paper proposes techniques to achieve lower thermal noise in the loop filters of NS SAR ADCs. An error feedback topology is used to build a more robust filter without integrators. A first order topology is chosen to reduce thermal noise and novel cascade of dynamic amplifiers are used to avoid the series switches on top-plate capacitor node of SAR ADC. On-chip digital calibration is used to enhance the performance of an ADC. A protoype of Noise Shape SAR ADC is fabricated in 28 nm CMOS technology to demonstrate these techniques. Measurements shows that the proposed architecture achieves SNDR and SFDR of 78.5 dB and 82.9 dB respectively.

Original languageEnglish
Title of host publication2024 31st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350377200
DOIs
Publication statusPublished - 2024
Event31st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2024 - Nancy, France
Duration: 18 Nov 202420 Nov 2024

Publication series

NameProceedings of the IEEE International Conference on Electronics, Circuits, and Systems
ISSN (Print)2994-5755
ISSN (Electronic)2995-0589

Conference

Conference31st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2024
Country/TerritoryFrance
CityNancy
Period18/11/2420/11/24

Keywords

  • ADC
  • Analog-to-Digital converter
  • Dynamic Amplifier
  • Error Feedback
  • Loop Filter
  • Noise shaping
  • SAR
  • Successive approximation regis-ter

Fingerprint

Dive into the research topics of 'A Digitally Calibrated 1stOrder Noise Shaped SAR ADC in 28 nm CMOS'. Together they form a unique fingerprint.

Cite this