A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces

M. J. Pilling; P. Gardner; R. Kausar; M. E. Pemble; M. Surman

doi:10.1016/S0039-6028(99)00079-5

A far-infrared RAIRS investigation of SnCl₄ and water on thin-film carbon and silica surfaces

M. J. Pilling
, P. Gardner
, R. Kausar
, M. E. Pemble
, M. Surman

Research output: Contribution to journal › Article › peer-review

Abstract

Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl₄ and water on thin-film silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl₄.

Original language	English
Pages (from-to)	22-26
Number of pages	5
Journal	Surface Science
Volume	433-435
DOIs	https://doi.org/10.1016/S0039-6028(99)00079-5
Publication status	Published - 2 Aug 1999
Event	Proceedings of the 1998 14th International Vacuum Congress(ICV-14), 10th Conference on Solid Surfaces(ICSS-10), 5th Conference on Nanometre-scale Science and Technology(NANO-5), 10th International Conference on Quantitative Surface Analysis(QSA-10) - Birmingham, United Kingdom Duration: 31 Aug 1998 → 4 Sep 1998

Keywords

Carbon
Chemisorption
Glass surfaces
Reflection spectroscopy
Silicon oxide
SnCl
Water

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10.1016/S0039-6028(99)00079-5

Cite this

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title = "A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces",

abstract = "Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 and water on thin-film silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4.",

keywords = "Carbon, Chemisorption, Glass surfaces, Reflection spectroscopy, Silicon oxide, SnCl, Water",

author = "Pilling, \{M. J.\} and P. Gardner and R. Kausar and Pemble, \{M. E.\} and M. Surman",

year = "1999",

month = aug,

day = "2",

doi = "10.1016/S0039-6028(99)00079-5",

language = "English",

volume = "433-435",

pages = "22--26",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier B.V.",

note = "Proceedings of the 1998 14th International Vacuum Congress(ICV-14), 10th Conference on Solid Surfaces(ICSS-10), 5th Conference on Nanometre-scale Science and Technology(NANO-5), 10th International Conference on Quantitative Surface Analysis(QSA-10) ; Conference date: 31-08-1998 Through 04-09-1998",

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TY - JOUR

T1 - A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces

AU - Pilling, M. J.

AU - Gardner, P.

AU - Kausar, R.

AU - Pemble, M. E.

AU - Surman, M.

PY - 1999/8/2

Y1 - 1999/8/2

N2 - Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 and water on thin-film silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4.

AB - Far-infrared RAIRS spectroscopy employing synchrotron radiation as a source, has been used to study the interaction of SnCl4 and water on thin-film silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4.

KW - Carbon

KW - Chemisorption

KW - Glass surfaces

KW - Reflection spectroscopy

KW - Silicon oxide

KW - SnCl

KW - Water

UR - https://www.scopus.com/pages/publications/0033356540

U2 - 10.1016/S0039-6028(99)00079-5

DO - 10.1016/S0039-6028(99)00079-5

M3 - Article

AN - SCOPUS:0033356540

SN - 0039-6028

VL - 433-435

SP - 22

EP - 26

JO - Surface Science

JF - Surface Science

T2 - Proceedings of the 1998 14th International Vacuum Congress(ICV-14), 10th Conference on Solid Surfaces(ICSS-10), 5th Conference on Nanometre-scale Science and Technology(NANO-5), 10th International Conference on Quantitative Surface Analysis(QSA-10)

Y2 - 31 August 1998 through 4 September 1998

ER -

A far-infrared RAIRS investigation of SnCl₄ and water on thin-film carbon and silica surfaces

Abstract

Keywords

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