A Kinetic Monte Carlo Simulator to Characterize Resistive Switching and Charge Conduction in Ni/HfO<inf>2</inf>/Si RRAMs
- Samuel Aldana
- , Pedro Garcia Fernandez
- , Rocio Romero-Zaliz
- , Mireia Bargalló Gonzalez
- , Francisco Jiménez-Molinos
- , Francesca Campabadal
- , Francisco Gómez-Campos
- , Juan Bautista Roldán Aranda
- University of Granada
- Institut de Microelectrònica de Barcelona, IMB-CNM (CSIC)
Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review