A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique

D. MacSweeney; K. G. McCarthy; L. Floyd; M. Riordan; L. Sattler; A. Mathewson; J. A. Power; S. C. Kelly

A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique

D. MacSweeney
, K. G. McCarthy
, L. Floyd
, M. Riordan
, L. Sattler
, A. Mathewson
, J. A. Power
, S. C. Kelly

School of Engineering and Architecture

University College Cork

Research output: Contribution to conference › Paper › peer-review

Abstract

In this paper, a novel method for the estimation of confidence intervals of extracted parameter values is proposed. The technique is based on a Bootstrap method which evaluates the error distributions which are associated with parameter extraction techniques. Using this technique, a confidence interval can then be estimated for extracted parameter values. Results are presented for DC, capacitance and high frequency measurements.

Original language	English
Pages	47-52
Number of pages	6
Publication status	Published - 2001
Event	ICMTS 2001. 2001 International Conference on Microelectronic Test Structures - Kobe, Japan Duration: 19 Mar 2001 → 22 Mar 2001

Conference

Conference	ICMTS 2001. 2001 International Conference on Microelectronic Test Structures
Country/Territory	Japan
City	Kobe
Period	19/03/01 → 22/03/01

Cite this

@conference{52ed31b152c14966a64674ab4ea60a1a,

title = "A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique",

abstract = "In this paper, a novel method for the estimation of confidence intervals of extracted parameter values is proposed. The technique is based on a Bootstrap method which evaluates the error distributions which are associated with parameter extraction techniques. Using this technique, a confidence interval can then be estimated for extracted parameter values. Results are presented for DC, capacitance and high frequency measurements.",

author = "D. MacSweeney and McCarthy, \{K. G.\} and L. Floyd and M. Riordan and L. Sattler and A. Mathewson and Power, \{J. A.\} and Kelly, \{S. C.\}",

year = "2001",

language = "English",

pages = "47--52",

note = "ICMTS 2001. 2001 International Conference on Microelectronic Test Structures ; Conference date: 19-03-2001 Through 22-03-2001",

}

TY - CONF

T1 - A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique

AU - MacSweeney, D.

AU - McCarthy, K. G.

AU - Floyd, L.

AU - Riordan, M.

AU - Sattler, L.

AU - Mathewson, A.

AU - Power, J. A.

AU - Kelly, S. C.

PY - 2001

Y1 - 2001

N2 - In this paper, a novel method for the estimation of confidence intervals of extracted parameter values is proposed. The technique is based on a Bootstrap method which evaluates the error distributions which are associated with parameter extraction techniques. Using this technique, a confidence interval can then be estimated for extracted parameter values. Results are presented for DC, capacitance and high frequency measurements.

AB - In this paper, a novel method for the estimation of confidence intervals of extracted parameter values is proposed. The technique is based on a Bootstrap method which evaluates the error distributions which are associated with parameter extraction techniques. Using this technique, a confidence interval can then be estimated for extracted parameter values. Results are presented for DC, capacitance and high frequency measurements.

UR - https://www.scopus.com/pages/publications/0034862790

M3 - Paper

AN - SCOPUS:0034862790

SP - 47

EP - 52

T2 - ICMTS 2001. 2001 International Conference on Microelectronic Test Structures

Y2 - 19 March 2001 through 22 March 2001

ER -

A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique

Abstract

Conference

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