A regenerative load system for the test of Intel VRM 9.1 compliant modules

  • B. O'Sullivan
  • , R. Morrison
  • , M. G. Egan
  • , J. Slowey
  • , B. Barry

Research output: Contribution to conferencePaperpeer-review

Abstract

The dissipative burn-in of dc-dc converters is an inefficient and costly process. This paper presents a highly efficient regenerative load specifically targeted at the burn-in of Voltage Regulator Modules (VRM) conforming to the Intel VRM 9.1. The converter also features the ability to test the high current slew rates demanded of the modern VRM.

Original languageEnglish
Pages298-303
Number of pages6
DOIs
Publication statusPublished - 2004
Event19th Annual IEEE Applied Power Electronics Conference and Exposition - APEC 2004 - Anaheim, CA., United States
Duration: 22 Feb 200426 Feb 2004

Conference

Conference19th Annual IEEE Applied Power Electronics Conference and Exposition - APEC 2004
Country/TerritoryUnited States
CityAnaheim, CA.
Period22/02/0426/02/04

Keywords

  • 12 V
  • ATE
  • Boost
  • Burn-in test law voltage
  • Dc/dc
  • Fast transient
  • High slew rate
  • Microprocessor
  • Regenerative load
  • Vrm

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