A thermal study of multilayer RRAMs based on HfO2 and Al2O3 oxides

  • Manuel Cazorla
  • , Samuel Aldana
  • , Marcos Maestro-Izquierdo
  • , Mireia Bargalló Gonzalez
  • , Francisco Jiménez-Molinos
  • , Francesca Campabadal
  • , Juan Bautista Roldán Aranda

Research output: Contribution to conferencePosterpeer-review

Original languageEnglish
Publication statusPublished - Jun 2018
Externally publishedYes
EventWODIM 2018 - 20th Workshop on Dielectrics in Microelectronics, 2018
- , Germany
Duration: 1 Jun 2018 → …

Conference

ConferenceWODIM 2018 - 20th Workshop on Dielectrics in Microelectronics, 2018
Country/TerritoryGermany
Period1/06/18 → …

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