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A Tight-Binding Based Analysis of the Band Anti-Crossing Model and Its Application in Ga(In)NAs Alloys

  • E. P. O'Reilly
  • , A. Lindsay
  • , S. Fahy
  • , S. Tomić
  • , P. J. Klar

Research output: Chapter in Book/Report/Conference proceedingsChapterpeer-review

Abstract

This chapter reviews some of the insights gained using the tight-binding method to analyze the band anti-crossing (BAC) model, and its application to describe the electronic structure of GaInNAs and related alloys. Using the tight-binding method, it is confirmed that N forms a resonant state above the Conduction Band Edge (CBE) in Ga(In)As, and that the interaction of the N resonant states with the CBE accounts for the strong band gap bowing observed in Ga(In)As. It is explicitly demonstrated that the alloy CBE (often referred to as the E_ level) can be described very accurately by the BAC model, in which the nitrogen levels are treated explicitly using a Linear Combination of Isolated Nitrogen Resonant States (LCINS). This analytical model provides a consistent fit to the ground and excited state transition energies measured across a wide range of samples. The model can be readily applied to describe any GalnNAs-based QW structures. Turning to the conduction band dispersion, showed that the two-level BAC model must be modified to give a quantitative understanding of measured electron mass values. It is concluded that the methods and insights presented in the chapter provide a strong base for further investigation and analysis of fundamental properties and also because of its potential device applications.

Original languageEnglish
Title of host publicationDilute Nitride Semiconductors
PublisherElsevier
Pages361-391
Number of pages31
ISBN (Electronic)9780080445021
DOIs
Publication statusPublished - 1 Jan 2005

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