An XPS study of the oxidation of reduced ceria-lanthana nanocrystals

P. Fleming; S. Ramirez; J. D. Holmes; M. A. Morris

doi:10.1016/j.cplett.2011.04.090

An XPS study of the oxidation of reduced ceria-lanthana nanocrystals

P. Fleming
, S. Ramirez
, J. D. Holmes
, M. A. Morris

School of Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

Detailed X-ray photoelectron spectroscopy (XPS) studies on the oxidation of an extensively cleaned, reduced ceria-lanthana solid solution (12.5 mol% La to Ce) was performed. Uptake of oxygen during oxidation followed a logarithmic dependence on exposure. Differential charging during oxidation suggests that the oxidation process is diffusion limited. No evidence for surface 3+ cerium states in the fully oxidised samples, which are anion defect free within the limits of experimental accuracy, was found. The data suggest that there is no evidence for the inherent stability of anion vacancies (associated with Ce ³⁺ sites) at the surface of these nanocrystals.

Original language	English
Pages (from-to)	51-57
Number of pages	7
Journal	Chemical Physics Letters
Volume	509
Issue number	1-3
DOIs	https://doi.org/10.1016/j.cplett.2011.04.090
Publication status	Published - 3 Jun 2011

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10.1016/j.cplett.2011.04.090

https://hdl.handle.net/10468/9701Licence: CC BY-NC-ND

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title = "An XPS study of the oxidation of reduced ceria-lanthana nanocrystals",

abstract = "Detailed X-ray photoelectron spectroscopy (XPS) studies on the oxidation of an extensively cleaned, reduced ceria-lanthana solid solution (12.5 mol\% La to Ce) was performed. Uptake of oxygen during oxidation followed a logarithmic dependence on exposure. Differential charging during oxidation suggests that the oxidation process is diffusion limited. No evidence for surface 3+ cerium states in the fully oxidised samples, which are anion defect free within the limits of experimental accuracy, was found. The data suggest that there is no evidence for the inherent stability of anion vacancies (associated with Ce 3+ sites) at the surface of these nanocrystals.",

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AU - Fleming, P.

AU - Ramirez, S.

AU - Holmes, J. D.

AU - Morris, M. A.

PY - 2011/6/3

Y1 - 2011/6/3

N2 - Detailed X-ray photoelectron spectroscopy (XPS) studies on the oxidation of an extensively cleaned, reduced ceria-lanthana solid solution (12.5 mol% La to Ce) was performed. Uptake of oxygen during oxidation followed a logarithmic dependence on exposure. Differential charging during oxidation suggests that the oxidation process is diffusion limited. No evidence for surface 3+ cerium states in the fully oxidised samples, which are anion defect free within the limits of experimental accuracy, was found. The data suggest that there is no evidence for the inherent stability of anion vacancies (associated with Ce 3+ sites) at the surface of these nanocrystals.

AB - Detailed X-ray photoelectron spectroscopy (XPS) studies on the oxidation of an extensively cleaned, reduced ceria-lanthana solid solution (12.5 mol% La to Ce) was performed. Uptake of oxygen during oxidation followed a logarithmic dependence on exposure. Differential charging during oxidation suggests that the oxidation process is diffusion limited. No evidence for surface 3+ cerium states in the fully oxidised samples, which are anion defect free within the limits of experimental accuracy, was found. The data suggest that there is no evidence for the inherent stability of anion vacancies (associated with Ce 3+ sites) at the surface of these nanocrystals.

UR - https://www.scopus.com/pages/publications/79957745798

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DO - 10.1016/j.cplett.2011.04.090

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VL - 509

SP - 51

EP - 57

JO - Chemical Physics Letters

JF - Chemical Physics Letters

IS - 1-3

ER -

An XPS study of the oxidation of reduced ceria-lanthana nanocrystals

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