Anisotropic electron g factor as a probe of the electronic structure of GaBix As1-x/ GaAs epilayers

  • Christopher A. Broderick
  • , Simone Mazzucato
  • , Hélène Carrère
  • , Thierry Amand
  • , Hejer Makhloufi
  • , Alexandre Arnoult
  • , Chantal Fontaine
  • , Omer Donmez
  • , Ayşe Erol
  • , Muhammad Usman
  • , Eoin P. O'Reilly
  • , Xavier Marie

Research output: Contribution to journalArticlepeer-review

Abstract

The electron Landé g factor (g∗) is investigated both experimentally and theoretically in a series of GaBixAs1-x/GaAs strained epitaxial layers, for bismuth compositions up to x=3.8%. We measure g∗ via time-resolved photoluminescence spectroscopy, which we use to analyze the spin quantum beats in the polarization of the photoluminescence in the presence of an externally applied magnetic field. The experimental measurements are compared directly to atomistic tight-binding calculations on large supercells, which allows us to explicitly account for alloy disorder effects. We demonstrate that the magnitude of g∗ increases strongly with increasing Bi composition x and, based on the agreement between the theoretical calculations and experimental measurements, elucidate the underlying causes of the observed variation of g∗. By performing measurements in which the orientation of the applied magnetic field is changed, we further demonstrate that g∗ is strongly anisotropic. We quantify the observed variation of g∗ with x, and its anisotropy, in terms of a combination of epitaxial strain and Bi-induced hybridization of valence states due to alloy disorder, which strongly perturbs the electronic structure.

Original languageEnglish
Article number195301
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume90
Issue number19
DOIs
Publication statusPublished - 4 Nov 2014

Fingerprint

Dive into the research topics of 'Anisotropic electron g factor as a probe of the electronic structure of GaBix As1-x/ GaAs epilayers'. Together they form a unique fingerprint.

Cite this