Application of artificial neural networks to the identification of weak electrical regions in large area MIM structures

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Microelectronics Reliability
DOIs	https://doi.org/10.1016/J.MICROREL.2021.114312
Publication status	Published - 2021

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@article{30d2f4a786754b3e863a6d5eb40bfd27,

title = "Application of artificial neural networks to the identification of weak electrical regions in large area MIM structures",

author = "J. Munoz-Gorriz and S. Monaghan and K. Cherkaoui and J. Sune and Hurley, \{P. K.\} and E. Miranda",

year = "2021",

doi = "10.1016/J.MICROREL.2021.114312",

language = "Undefined/Unknown",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - Application of artificial neural networks to the identification of weak electrical regions in large area MIM structures

AU - Munoz-Gorriz, J.

AU - Monaghan, S.

AU - Cherkaoui, K.

AU - Sune, J.

AU - Hurley, P. K.

AU - Miranda, E.

PY - 2021

Y1 - 2021

UR - https://publons.com/wos-op/publon/59484025/

U2 - 10.1016/J.MICROREL.2021.114312

DO - 10.1016/J.MICROREL.2021.114312

M3 - Article

SN - 0026-2714

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -