Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

C. Trager-Cowan; G. Naresh-Kumar; B. Hourahine; P. R. Edwards; J. Bruckbauer; R. W. Martin; C. Mauder; A. P. Day; G. England; A. Winkelmann; P. J. Parbrook; A. J. Wilkinson

doi:10.1017/S1431927612005272

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

C. Trager-Cowan
, G. Naresh-Kumar
, B. Hourahine
, P. R. Edwards
, J. Bruckbauer
, R. W. Martin
, C. Mauder
, A. P. Day
, G. England
, A. Winkelmann
, P. J. Parbrook
, A. J. Wilkinson

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	684-685
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
DOIs	https://doi.org/10.1017/S1431927612005272
Publication status	Published - Jul 2012

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10.1017/S1431927612005272

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Trager-Cowan, C., Naresh-Kumar, G., Hourahine, B., Edwards, P. R., Bruckbauer, J., Martin, R. W., Mauder, C., Day, A. P., England, G., Winkelmann, A., Parbrook, P. J., & Wilkinson, A. J. (2012). Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films. Microscopy and Microanalysis, 18, 684-685. https://doi.org/10.1017/S1431927612005272

@article{56490cfd6b5c4082ac4a7635ea35d31d,

title = "Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films",

author = "C. Trager-Cowan and G. Naresh-Kumar and B. Hourahine and Edwards, \{P. R.\} and J. Bruckbauer and Martin, \{R. W.\} and C. Mauder and Day, \{A. P.\} and G. England and A. Winkelmann and Parbrook, \{P. J.\} and Wilkinson, \{A. J.\}",

year = "2012",

month = jul,

doi = "10.1017/S1431927612005272",

language = "English",

volume = "18",

pages = "684--685",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

Trager-Cowan, C, Naresh-Kumar, G, Hourahine, B, Edwards, PR, Bruckbauer, J, Martin, RW, Mauder, C, Day, AP, England, G, Winkelmann, A, Parbrook, PJ & Wilkinson, AJ 2012, 'Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films', Microscopy and Microanalysis, vol. 18, pp. 684-685. https://doi.org/10.1017/S1431927612005272

TY - JOUR

T1 - Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

AU - Trager-Cowan, C.

AU - Naresh-Kumar, G.

AU - Hourahine, B.

AU - Edwards, P. R.

AU - Bruckbauer, J.

AU - Martin, R. W.

AU - Mauder, C.

AU - Day, A. P.

AU - England, G.

AU - Winkelmann, A.

AU - Parbrook, P. J.

AU - Wilkinson, A. J.

PY - 2012/7

Y1 - 2012/7

UR - https://www.scopus.com/pages/publications/85007997373

U2 - 10.1017/S1431927612005272

DO - 10.1017/S1431927612005272

M3 - Article

AN - SCOPUS:85007997373

SN - 1431-9276

VL - 18

SP - 684

EP - 685

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

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