TY - CHAP
T1 - Automated model generation for complex systems
AU - Provan, Gregory
AU - Wang, Jun
PY - 2008
Y1 - 2008
N2 - It is critical to use automated generators for synthetic models and data, given the sparsity of benchmark models for empirical analysis and the cost of generating models by hand. We describe an automated generator for benchmark models that is based on using a compositional modeling framework and employs graphical models for the system topology. We propose two novel topological models, and demonstrate their advantages, over existing graphical models, in better capturing the topological and functional properties of a class of real system, discrete circuits. We compare generated models to real systems (drawn from the ISCAS benchmark suite) according to two criteria: topological fidelity and diagnostics efficiency. Based on this comparison we identify parameters necessary for the autogenerated models to generate benchmark diagnosis circuit models with realistic properties.
AB - It is critical to use automated generators for synthetic models and data, given the sparsity of benchmark models for empirical analysis and the cost of generating models by hand. We describe an automated generator for benchmark models that is based on using a compositional modeling framework and employs graphical models for the system topology. We propose two novel topological models, and demonstrate their advantages, over existing graphical models, in better capturing the topological and functional properties of a class of real system, discrete circuits. We compare generated models to real systems (drawn from the ISCAS benchmark suite) according to two criteria: topological fidelity and diagnostics efficiency. Based on this comparison we identify parameters necessary for the autogenerated models to generate benchmark diagnosis circuit models with realistic properties.
KW - Automated model generation
KW - Diagnostics)
KW - Modeling (Model development
UR - https://www.scopus.com/pages/publications/77955175532
M3 - Chapter
AN - SCOPUS:77955175532
SN - 9780889867116
T3 - Proceedings of the IASTED International Conference on Modelling, Identification, and Control, MIC
BT - Proceedings of the 27th IASTED International Conference on Modelling, Identification, and Control
T2 - 27th IASTED International Conference on Modelling, Identification, and Control
Y2 - 11 February 2008 through 13 February 2008
ER -