@inbook{6fe0289f667f4d8f8a83f00d57345980,
title = "Automatic ASET sensitivity evaluation of a custom-designed 180nm CMOS technology operational amplifier",
abstract = "This work presents a SPICE-based automatic SET sensitivity evaluation of a 180nm CMOS full-custom Operational Amplifier. The set-up uses the well known double exponential current law to inject SET into every sensitive node in the circuit hierarchy. The pulse parameters are obtained according to a previously generated population of particles with randomly assigned energies and species, the node bias condition at the instant of the strike and an empirical model obtained through TCAD simulations. The circuit is evaluated transistor-wise for each ion of the generated database and the output waveforms are processed in time and frequency domain to obtain figures of merit of the hardness of the proposed design on a given radioactive environment. Results allow to identify the most sensitive devices and the expected error rate for the projected application, allowing to conduct hardening techniques during early design stages.",
keywords = "Analog CMOS, ASET, Heavy Ions, SPICE",
author = "Andr{\'e}s Fontana and Pazos, \{Sebasti{\'a}n M.\} and Aguirre, \{Fernando L.\} and F{\'e}lix Palumbo",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications, CAMTA 2017 ; Conference date: 27-07-2017 Through 28-07-2017",
year = "2017",
month = oct,
day = "4",
doi = "10.1109/CAMTA.2017.8058136",
language = "English",
series = "2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications, CAMTA 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "21--31",
editor = "Pedro Julian and Andreou, \{Andreas G.\}",
booktitle = "2017 Argentine Conference of Micro-Nanoelectronics, Technology and Applications, CAMTA 2017",
address = "United States",
}