Carrier transport in (In,Ga)N quantum well systems: Connecting atomistic tight-binding electronic structure theory to drift-diffusion simulations

  • Michael O'Donovan
  • , Patricio Farrell
  • , Timo Streckenbach
  • , Thomas Koprucki
  • , Stefan Schulz

Research output: Chapter in Book/Report/Conference proceedingsChapterpeer-review

Abstract

Understanding the impact of the alloy microstructure on carrier transport in (In,Ga)N/GaN quantum well systems is important for aiding device design. We study the impact that alloy fluctuations have on uni-polar carrier transport for both electrons (n-i-n junction) and holes (p-i-p junction) using a multiscale framework. To do so we connect an atomistic tight-binding model to a 3D macroscale drift-diffusion solver, ddfermi, which includes quantum corrections through the localization landscape theory. Results indicate that for electrons, alloy fluctuations lead to a higher current at a fixed bias compared to a calculation without alloy fluctuations. In contrast, alloy induced hole localization effects results in a reduced current.

Original languageEnglish
Title of host publication2022 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2022
PublisherIEEE Computer Society
Pages97-98
Number of pages2
ISBN (Electronic)9781665478991
DOIs
Publication statusPublished - 2022
Event2022 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2022 - Turin, Italy
Duration: 12 Sep 202216 Sep 2022

Publication series

NameProceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD
Volume2022-September
ISSN (Print)2158-3234

Conference

Conference2022 International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2022
Country/TerritoryItaly
CityTurin
Period12/09/2216/09/22

Keywords

  • III-Nitrides
  • multiscale modelling
  • quantum wells
  • transport

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